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Transistor and manufacturing method thereof

A manufacturing method and transistor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as unstable device amplification factors, and achieve the effect of stabilizing current amplification factors

Active Publication Date: 2019-01-01
临沂宏超电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

On the surface of the base region and the emitter region, a large number of processes will be experienced, such as implantation, etching, metallization, etc., which will bring a large number of defects to the surface of the base region and the emitter region, which will eventually lead to a very unstable amplification factor of the device.

Method used

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  • Transistor and manufacturing method thereof
  • Transistor and manufacturing method thereof
  • Transistor and manufacturing method thereof

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] see figure 1 and figure 2 , a manufacturing method of a transistor, comprising:

[0017] Step S01: providing a substrate 1 of a first conductivity type;

[0018] Step S02: growing an epitaxial layer 2 with a second conductivity type on the first surface of the substrate 1, the epitaxial layer 2 includes a first layer 21, a second layer formed sequentially upward on the first surface of the substrate 1 The second floor 22 and the third floor 23;

[0019] Step S03: forming a base region 3 of the first conductivity type on the epitaxial layer 2, the base region 3 penetrates the epitaxial layer 2 and is connected to the substrate 1 at one end, so that the epitaxial layer 2 forms an emission region 4 The emitter region 4 includes an emitter layer 42 formed in the region of the second layer 22, a first isolation layer 41 formed in the region of the first layer 21, and a first isolation layer 41 formed in the region of the third layer 23 The second isolation layer 43;

...

Embodiment 2

[0035] see figure 2 , a transistor manufactured based on the manufacturing method in Embodiment 1, comprising: a substrate 1 of a first conductivity type; an epitaxial layer 2 of a second conductivity type grown on the first surface of the substrate 1; a first A conductivity type base region 3 runs through the epitaxial layer 2 and is connected to the substrate 1 at one end; an emitter region 4 is formed in the epitaxial layer region on one side of the base region, and the emitter region 4 is included in the A first isolation layer 41, an emitter layer 42, and a second isolation layer 43 are sequentially formed upward on the first surface of the substrate 1; and a collector region 5 is formed in the region of the epitaxial layer 2 on the other side of the base region 3 .

[0036] It can be understood that by adopting a three-layer epitaxial structure, the contact interface between the emitter layer 42 and the base region 3 does not need to go through processes such as high-t...

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Abstract

The present invention relates to a transistor and a manufacturing method thereof. The transistor comprises: a first conductive type of substrate; a second conductive type of epitaxial layer grown at the first surface of the substrate; a first conductive type of base area penetrating the epitaxial layer and having one end connected with the substrate to allow the epitaxial layer to form an emissionarea and a collector area; the emission area comprise a first isolation layer, an emission electrode layer and a second isolation layer formed upwards in order at the first surface of the substrate;and the collector area is formed in the epitaxial layer area, far away from one side of the emission area, of the base area. The transistor is simple in structure and stable in amplification coefficient.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a transistor and a manufacturing method thereof. Background technique [0002] In the prior art, the base region is formed by an annealing process after the implantation process, and the junction depth and junction morphology of the base area are greatly affected by the annealing process, while the polycrystalline emitter process is all implanted with a large dose in the polycrystalline body, and then high temperature and rapid Thermal annealing, so that impurities diffuse into the base region to form the emitter junction. On the surface of the base region and the emitter region, a large number of processes will be experienced, such as implantation, etching, metallization, etc., which will bring a large number of defects to the surface of the base region and the emitter region, and eventually cause the amplification factor of the device to be very unstable. Contents of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/735H01L29/167H01L21/331
CPCH01L29/167H01L29/6625H01L29/735
Inventor 郑晓玲
Owner 临沂宏超电子有限公司