Flip chip with patterned current expansion layer and manufacturing method of flip chip
A technology of current spreading layer and flip chip, which is applied in the direction of circuits, electrical components, semiconductor devices, etc., can solve the problems of LED chip forward voltage increase, difficult control of the manufacturing process, and chip brightness reduction, etc., to improve the ohmic contact area , avoid poor ohmic contact, and improve the effect of current injection efficiency
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[0028] The specific embodiments of the present invention will be described below in conjunction with the accompanying drawings.
[0029] The invention provides a novel method for manufacturing a flip chip with a patterned current spreading layer, which specifically includes the following steps:
[0030] S1. Epitaxial wafer growth;
[0031] Such as figure 1 As shown, an N-GaN layer 20 , a multiple quantum well 30 (MQW, Multiple Quantum Well) as a light emitting layer, and a P-GaN layer 40 are grown sequentially on a substrate 10 . The N-GaN layer 20, the multiple quantum wells 30, and the P-GaN layer 40 are used as epitaxial layers.
[0032] Wherein, the material of the substrate 10 may be any one of sapphire, silicon carbide, silicon, gallium arsenide, gallium nitride, aluminum nitride and spinel, and the material of the substrate 10 in this example is sapphire. The epitaxial layer can be formed by any current deposition method (MOCVD, PECVD, etc.) or other known techniques...
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