Light-emitting
diode (LED), with: a GaN-based N-type
compound semiconductor layer (57, 157); a GaN-based P-type
compound semiconductor layer (63, 161); and an active region (59, 89, 159) of a multi-
quantum pot structure with alternating laminated InGaN pot
layers (71, 171) and junction
layers (74, 84a, 84b, 83c, 173, 175, 177, 179), wherein the active region (59, 89, 159) is arranged between the N-type and P-type
compound semiconductor layers (57, 157, 63, 161), wherein at least one of the barrier layers (74, 84a, 84b, 83c, 173, 175, 177, 179) in the active region (59, 89, 159) has an InGaN
barrier layer (73, 83a, 83b, 83c) and a Si-doped GaN
barrier layer (75), a
doping concentration of Si in the InGaN
barrier layer (73, 83a, 83b, 83c) is lower than that of the Si-doped GaN barrier layer (75) and the Si-doped GaN barrier layer (75) is positioned closer to the P-type compound
semiconductor layer (63, 161) than the InGaN barrier layer (73, 83a, 83b, 83c).