5 results about "Longwave" patented technology

Transparent IR conductive (TIRC) coatings used for EMI protection of, for example, longwave IR windows and domes are disclosed. In some non-limiting embodiments, the TIRC coating may be a BaCuSF coating. Related systems and methods are also disclosed.

This invention discloses a rubidium atomic clock discipline method and related products based on the fusion of BeiDou and longwave dual-source signals, belonging to the field of high-precision time and frequency synchronization technology. The method of this invention simultaneously measures the first time difference between the rubidium atomic clock and the BeiDou reference time signal, and the second time difference with the longwave reference time signal, fusing the short-term accuracy of BeiDou with the long-term stability of longwave. An extended Kalman filter model is constructed, whose state vector includes a first type of state variable representing the time-frequency characteristics of the rubidium atomic clock and a second type of state variable representing the fused time difference between BeiDou and longwave. The first and second time difference values ​​are used as observation inputs for iterative estimation, synchronously updating the optimal values ​​of the two types of state variables. A frequency adjustment is generated based on the optimal estimate, and closed-loop control is performed on the output frequency of the rubidium atomic clock. This invention can synergistically utilize the advantages of BeiDou and longwave dual-source signals to achieve time synchronization with high instantaneous accuracy and long-term reliability.

The preparation method of the infrared long-wave-pass optical filter comprises the following steps: S1, cleaning the surface of a product serving as a glass substrate of a lens; s2, the treated lens is put into a tool clamp, the tool clamp with the lens is hung into a cavity of a vacuum coating machine, and the temperature of the cavity is set to be 200 DEG C; s3, the vacuum coating machine is started to vacuumize, the vacuum degree reaches 1.0 * 10 <-3 > Pa, and a radio frequency ion source for auxiliary coating of the vacuum coating machine is turned on for cleaning; s4, plating a short-wave-pass film system on the first surface of the lens; s5, after plating of the short-wave-pass film system on the first surface of the lens is completed, the tool clamp and the product are taken out after the cavity is cooled to 60-70 DEG C or below; s6, repeating the steps S1 to S3; s7, plating an antireflection film system on the second surface of the lens; and S8, after plating of the antireflection film system on the second surface of the lens is completed, the tool clamp and the product are taken out after the cavity is cooled to 60-70 DEG C or below.

Disclosed is a device that will take radiometric images of the shortwave spectrum from 0.2-2 μm, which can then be processed into a spherical panoramic image. This single source of data can then be used to produce a wide range of functional outputs for radiative energy analysis, from architectural performance and thermal comfort analysis to replacing the array of sensors required to make specific biometeorological measurements, such as Global Horizontal Irradiance (GHI), Direct Normal Irradiance (DNI), Diffuse Horizontal Irradiance (DHI), Sky View Factor (SVF), and / or Global Tilted Irradiance (GTI). The data is also combined with a longwave array detector to produce full-spectrum radiative energy measurements.

The present invention provides an inspection device. A light source emits a mixed light beam to an object to enable photoluminescence of the object and generating an inspection light beam. After the inspection light beam passes through one of a plurality of filters, it is emitted to a beam splitter. A part of the inspection light beam is emitted to a shortwave filter while the other part is emitted to a longwave filter. The shortwave filter filters out the shortwaves of the first split light beam and the filtered first split light beam is emitted to a first sensing element. The longwave filter filters out the longwaves of the second split light beam and the filtered second split light beam is emitted to a second sensing element. The filter conversion module uses a conversion structure to alter the plurality of filters.