The invention discloses a white-light interference lens center thickness measuring system and a method, and belongs to the technical field of optical precise measurement, so as to solve the technical problems that the prior lens center thickness measuring device is low in measuring precision and small in dynamic measuring range. The white-light interference lens center thickness measuring system comprises a supercontinuum source, a photodetector, a 1:1 optical fiber coupler, a measuring arm, a reference arm, a first optical fiber, a second optical fiber and a data processing unit, wherein the measuring arm comprises a third optical fiber and a focusing lens; and the reference arm comprises a fourth optical fiber, a self-focusing lens, a scanning angle reflector, a plane mirror, a displacement mechanism and a length-measuring interferometer system. The precision of the system can reach 0.2 mum(3sigma) and the dynamic range can reach 1.5m.