White-light interference lens center thickness measuring system and method

A technology of lens center and white light interference, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of low measurement accuracy and small dynamic range of measurement, achieve accurate interpretation, improve anti-vibration ability, and improve signal-to-noise ratio Effect

Active Publication Date: 2014-11-19
BEIJING GUOWANG OPTICAL TECH CO LTD
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Problems solved by technology

[0008] The purpose of the present invention is to provide a white light interference lens center thickness measurement system and method to s...

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  • White-light interference lens center thickness measuring system and method
  • White-light interference lens center thickness measuring system and method
  • White-light interference lens center thickness measuring system and method

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Embodiment Construction

[0040] Further illustrate the present invention below in conjunction with accompanying drawing.

[0041] Such as figure 1 Said, the central thickness measurement system of white light interference lens of the present invention comprises: supercontinuum light source 1, photodetector 2, 1:1 optical fiber coupler 3, measuring arm 4, reference arm 5, first optical fiber 6, second optical fiber 7 and a data processing unit, wherein the measurement arm 4 includes a third optical fiber 8 and a focusing mirror 10, and the reference arm 5 includes a fourth optical fiber 9, a self-focusing lens 12, a scanning angle mirror 13, a plane mirror 14, and a displacement mechanism 15 and length measuring interferometer system 16 .

[0042] The supercontinuum light source 1 is connected with the 1:1 fiber coupler 3 through the first optical fiber 6; the photodetector 2 is connected with the 1:1 fiber coupler 3 through the second optical fiber 7; one end of the third optical fiber 8 is connected w...

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Abstract

The invention discloses a white-light interference lens center thickness measuring system and a method, and belongs to the technical field of optical precise measurement, so as to solve the technical problems that the prior lens center thickness measuring device is low in measuring precision and small in dynamic measuring range. The white-light interference lens center thickness measuring system comprises a supercontinuum source, a photodetector, a 1:1 optical fiber coupler, a measuring arm, a reference arm, a first optical fiber, a second optical fiber and a data processing unit, wherein the measuring arm comprises a third optical fiber and a focusing lens; and the reference arm comprises a fourth optical fiber, a self-focusing lens, a scanning angle reflector, a plane mirror, a displacement mechanism and a length-measuring interferometer system. The precision of the system can reach 0.2 mum(3sigma) and the dynamic range can reach 1.5m.

Description

technical field [0001] The invention relates to a system and method for measuring the central thickness of a white light interference lens, belonging to the technical field of optical precision measurement. Background technique [0002] In the field of optics, the three basic parameters of a lens are central thickness, refractive index and radius of curvature. The processing accuracy of the central thickness of the lens will directly affect the overall performance of the lens such as focal length and aberration, and then affect the performance of the entire optical system. In the installation and adjustment of the optical system, the optical axis deflection angle, radial offset and axial clearance of the lens need to be precisely adjusted according to the center thickness of the lens. Therefore, the higher the measurement accuracy of the lens center thickness, the more difficult and expensive the installation and adjustment lower. With the emergence of ultra-precision engin...

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Application Information

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IPC IPC(8): G01B11/06
Inventor 彭石军苗二龙王汝冬高松涛隋永新杨怀江
Owner BEIJING GUOWANG OPTICAL TECH CO LTD
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