Soft X ray double-frequency grating shearing interference system

A dual-frequency grating and interference system technology, applied in X/γ/cosmic radiation measurement, radiation measurement, measurement devices, etc., can solve problems such as blurred plasma boundaries and achieve a clear boundary effect

Active Publication Date: 2014-04-02
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

[0006] The purpose of the present invention is to solve the problem that the current shearing interference system cannot be used in the short wave band (especially the soft X-ray band) for plasma diagnosis
The system structure design of two imaging mirrors at the same time eliminates the aberration problem caused by the diffraction element and solves the boundary blur problem of the measured plasma

Method used

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  • Soft X ray double-frequency grating shearing interference system
  • Soft X ray double-frequency grating shearing interference system
  • Soft X ray double-frequency grating shearing interference system

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Embodiment

[0034] figure 1 It is a structural diagram of an embodiment of the present invention, and its specific structure and parameters are described as follows:

[0035] The size of the first spherical imaging mirror 3 is 20mm×6mm, the material is quartz glass, the reflection film is a multi-layer dielectric film, and the reflection band is 13-15nm. The incident angle of the X-ray laser to the first spherical imaging mirror 3 is 1.5°. The radius of curvature of the spherical mirror of the first spherical imaging mirror 3 is 700 mm, and the distance between the target to be measured and the spherical mirror 3 is 350 mm. The angle between the first spherical imaging mirror 3 and the dual-frequency grating 4 is 94.5°, and the incident angle of the soft X-ray laser on the dual-frequency grating 4 is 84°. The size of the soft X-ray dual-frequency grating is 60mm×60mm×10mm, the linear density of the soft X-ray dual-frequency grating is 1000 lines / mm and 1003 lines / mm, and the surface i...

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Abstract

The invention provides a soft X ray double-frequency grating shearing interference system. The soft X ray double-frequency grating shearing interference system adopts a double-frequency grating as a soft X ray shearing interference component; by utilizing a grazing incidence condition, two groups of (-1)-grade diffraction light beams of the grating are subjected to self shearing interference; and the wavefront of a X ray laser passing through a plasma is detected. Two imaging systems with multi-film spherical mirrors are adopted in a shearing interferometer, and the clear boundary of the plasma can be obtained. By using the soft X ray double-frequency grating shearing interference system, the shearing interference system is successfully applied to a soft X ray waveband; by utilizing the characteristic that the shearing interference system shares an optical path, the problem that the aplanatism in a testing system of a Mach-Zehnder interferometer is difficult to regulate is solved; and a key technique is provided for the diagnosis of the electron density of the plasma by utilizing a shearing method.

Description

technical field [0001] The present invention relates to the technical field of shearing interference systems, in particular to a soft X-ray dual-frequency grating shearing interference system, which is a shearing interferometer system working in the short-wave band (soft X-ray band). The density diagnosis of the plasma is carried out by using soft X-rays, which uses the shear interference pattern of the X-ray wavefront after passing through the plasma to obtain information such as the density of the plasma. Background technique [0002] Prior art 1 (see literature: Jorge Filevich, Jorge J.Rocca, Mario C.Marconi, et al. "picosecond-resolution soft-x-ray laser plasma interferometry". Applied Optics, Vol.43, 3938-3946, 2004 ) for plasma diagnostics using a Mach-Zehnder (M-Z) interferometry system. The working principle of this method is simple, and the result processing is also relatively convenient. In interferometric diagnosis, after the probe laser beam is split by the gra...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/00
Inventor 刘正坤邱克强刘颖徐向东付绍军
Owner UNIV OF SCI & TECH OF CHINA
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