Method for enhancing antistatic ability of GaN-based light-emitting diode
A light-emitting diode, gallium nitride-based technology, applied in circuits, electrical components, semiconductor devices, etc., can solve problems such as poor machining performance, device failure, and high price
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0013] (1) Substrate 1: first anneal the sapphire substrate at a temperature of 1050°C in a pure hydrogen atmosphere, and then perform nitriding treatment;
[0014] (2) Low-temperature buffer layer 2: lower the temperature to 585°C, and grow a 20nm-thick low-temperature GaN nucleation layer;
[0015] (3) High-temperature buffer layer 3: After the growth of the low-temperature buffer layer 2 is completed, stop feeding TMGa, raise the substrate temperature by 1050° C., and perform annealing treatment on the low-temperature buffer layer 2 in situ. The annealing time is 8 minutes; after annealing , growing high-temperature undoped GaN with a thickness of 0.8 μm;
[0016] (4) After the 0.8 μm thick high-temperature undoped GaN high-temperature buffer layer 3 grows, five cycles of AlGaN / GaN (AlGaN) are grown in a pure hydrogen atmosphere. 0.2 Ga 0.8 N / GaN) superlattice structure 4, aluminum gallium nitride (Al 0.2 Ga 0.8 N) has the same thickness as gallium nitride (GaN), that i...
Embodiment 2
[0030] The difference between the epitaxial process of embodiment 2 and embodiment 1 is that aluminum gallium nitride / gallium nitride (Al x Ga 1-x N / GaN, 00.2 Ga 0.8 N) and the gallium nitride (GaN) well layer both have a thickness of 6nm. After the chip manufacturing process and ESD sampling test under the same conditions, it can resist static electricity: the human body model is 4000V.
Embodiment 3
[0032] The difference between the epitaxial process of embodiment 3 and embodiment 1 is that aluminum gallium nitride / gallium nitride (Al x Ga 1-x N / GaN, 0
PUM
Property | Measurement | Unit |
---|---|---|
Thickness | aaaaa | aaaaa |
Thickness | aaaaa | aaaaa |
Thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap