Integrated vertical target test device and test method for multiple targets

A test device and multi-target technology, which is applied to measuring devices, optical devices, instruments, etc., can solve the problem of inability to accurately match, identify and block multiple targets

Active Publication Date: 2019-03-29
XIAN TECHNOLOGICAL UNIV
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] In view of the above-mentioned problems existing in the prior art, the purpose of the present invention is to provide a device and method that meet the requirements of multi-target multi-parameter matching and recognition testing, so as to solve the problem that the target parameter measurement device cannot accurately match and identify multiple targets that overlap and overlap, especially projectiles. Problems with Fragmentation Targets from Proximity Explosions

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  • Integrated vertical target test device and test method for multiple targets
  • Integrated vertical target test device and test method for multiple targets
  • Integrated vertical target test device and test method for multiple targets

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Embodiment Construction

[0041] In order to make the purpose, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings of the embodiments of the present disclosure. Apparently, the described embodiments are some of the embodiments of the present disclosure, not all of them. Based on the described embodiments of the present disclosure, all other embodiments obtained by persons of ordinary skill in the art without creative effort fall within the protection scope of the present disclosure.

[0042] Unless otherwise defined, the technical terms or scientific terms used in the present disclosure shall have the usual meanings understood by those skilled in the art to which the present disclosure belongs. "First", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are o...

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Abstract

The invention discloses an integrated vertical target test device and test method for multiple targets. The test device comprises a high speed area array CCD target, a detection frame and a host computer. A first detection light curtain, a second detection light curtain, a third detection light curtain, a fourth detection light curtain and a fifth detection light curtain are disposed inside the detection frame. The high speed area array CCD target is mounted at the bottom of the detection frame. The host computer is connected to the high speed area array CCD target through a cable. The centerof the field of view of the high speed area array CCD target is located in the middle of the second detection light curtain and the fourth detection light curtain, and the field of view intersects with the second detection light curtain and the fourth detection light curtain. The integrated vertical target test device and test method for multiple targets can accurately match the identified high-speed repeating targets or fragment groups generated by the explosion of weapons and ammunition, and can measure parameters such as flight direction, speed and distribution of the multiple targets withhigh precision.

Description

technical field [0001] The invention relates to the field of photoelectric testing, in particular to an integrated multi-target vertical target testing device and testing method. Background technique [0002] In the field of weapon testing, high-precision measurement of parameters such as speed and dispersion of multiple targets is an important theoretical basis for weapon verification and target damage effectiveness evaluation. Due to the diversity and randomness of multiple targets in the flight process, when passing through the detection area, there will be overlapping and simultaneous arrival at the same detection light curtain. At this time, the test system cannot accurately match and identify multiple targets, resulting in the inability to measure the parameters of multiple targets with high precision. , especially for the test of near-explosive fragmentation targets in space. Due to the large dispersion of fragments produced at the moment of explosion, and the differe...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/002
Inventor 李翰山张晓倩
Owner XIAN TECHNOLOGICAL UNIV
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