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Test circuit, equipment and system

A technology for testing circuits and circuits, applied in the field of electronics, can solve problems such as large safety hazards

Pending Publication Date: 2019-07-12
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the output of the above-mentioned withstand voltage test is high voltage, and the safety hazard of frequent manual line changes is relatively large.

Method used

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  • Test circuit, equipment and system
  • Test circuit, equipment and system
  • Test circuit, equipment and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0089] In order to implement parallel testing of multiple loops, an embodiment of the present application provides a testing circuit. The test circuit may include multiple test energy sources (eg, M voltage sources and / or P current sources). Wherein, M and P are both positive integers. In this application, other letters used to represent quantities (such as N and Q, etc.) are also positive integers unless otherwise specified, and will not be described in detail in the following.

[0090] Among them, the test energy source refers to the circuit used to provide the tested product with energy (such as high voltage, high current) for testing, and the test energy source can be a voltage source (such as Figure 7 voltage conversion in voltage 311, voltage conversion circuit 312), or a current source (such as Figure 7 The current conversion circuit 313 and the current conversion circuit 314 in the . The present application may include multiple current sources and multiple voltage ...

Embodiment 2

[0095] In order to implement parallel withstand voltage tests on multiple withstand voltage test circuits, an embodiment of the present application provides a test circuit. The test circuit may include: a test energy source (including M voltage sources), a high voltage switch circuit and a controller.

[0096] For example, M=2. Of course, M may also be greater than 2, for example, M=3, or M=4, and so on. The above-mentioned high-voltage switch circuit may include M high-voltage input terminals, N high-voltage output terminals, and a first switch component, where N≧M. For example, when M=2, N=4, or N=3, etc. The above N high-voltage output terminals are used to connect to the first test node of the withstand voltage test loop (such as the InPut node of the "In Put-PE" loop, the Out Put node of the "Out Put-PE" loop, the "In Put-Out Put" In Put node of the loop).

[0097] The above-mentioned controller is connected with the first switch assembly. The first switch assembly i...

Embodiment 3

[0113] In combination with the second embodiment, when the test circuit 120 performs the withstand voltage test on a plurality of withstand voltage test circuits in parallel, different parameters can be set for different withstand voltage test circuits. That is, the test circuit 120 can provide different constant voltage sources for different withstand voltage test loops. For example, the constant voltage source provided by the voltage conversion circuit 311 for the "In Put-PE" loop is different from the constant voltage source provided by the voltage conversion circuit 312 for the "Out Put-PE" loop.

[0114] Specifically, each voltage source (ie, the voltage conversion circuit) can output a voltage corresponding to the test parameter according to the test parameter of the corresponding withstand voltage test loop.

[0115] For example, it is assumed that the test parameter of the "In Put-PE" loop can be the first test parameter, such as 3000V. The test parameter of the "OutP...

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Abstract

The invention discloses a test circuit, equipment and system, and relates to the technical field of electronics for realizing parallel test of a plurality of loops. The test circuit comprises a plurality of test energy sources (such as M voltage sources), a controller and a high-voltage switch circuit (including N high-voltage output ends for being connected to a first test node of a withstand voltage test loop, a first switch component and M high-voltage input ends which are in one-to-one correspondence with the M voltage sources, wherein N is larger than or equal to M). A first output end ofeach voltage source is connected to one high-voltage input end, and a second output end of each voltage source is connected to a second test node of the withstand voltage test loop. The controller isconnected to each voltage source for controlling the X voltage sources to simultaneously output voltage, wherein X is greater than or equal to 2 and less than or equal to M; the controller is furtherconnected to the first switch component for controlling the first switch component in order to simultaneously connect the X high-voltage input ends respectively connected to the X voltage sources andthe X high-voltage output ends respectively; and the X high-voltage output ends are respectively used for being connected to the first test node of the withstand voltage test loop.

Description

[0001] This application claims the priority of the Chinese patent application filed on January 11, 2019 with the application number 201910035219.8 and the application name "Parallel Asynchronous Safety Cloud Testing of Multi-Instrument Cyclic Cascading", the entire contents of which are by reference Incorporated in this application. technical field [0002] The present application relates to the field of electronic technology, and in particular, to a testing circuit, equipment and system. Background technique [0003] Safety test refers to the withstand voltage test and ground impedance test of the products to be shipped. Among them, in the withstand voltage test, the safety tester can apply a high voltage to the two nodes of each withstand voltage test circuit to detect whether the corresponding circuit has leakage. In the grounding impedance test, the safety tester can increase the current between each node to be tested and the protective conductor (PE) to test whether th...

Claims

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Application Information

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IPC IPC(8): G01R31/12G01R31/01G01R27/20G01R1/30G01R1/04
CPCG01R31/12G01R31/01G01R27/20G01R1/30G01R1/0416
Inventor 陈立洋
Owner HUAWEI TECH CO LTD