Four-frequency cycle slip detection and repairing method based on linear combination optimization

A technology of cycle slip detection and linear combination, which is applied in radio wave measurement systems, measurement devices, satellite radio beacon positioning systems, etc.

Active Publication Date: 2019-11-12
NAT UNIV OF DEFENSE TECH
View PDF8 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current research on cycle slip detection and repair based on four-frequency observation data is still basically blank. It is necessary to perform linear combination optimizatio

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Four-frequency cycle slip detection and repairing method based on linear combination optimization
  • Four-frequency cycle slip detection and repairing method based on linear combination optimization
  • Four-frequency cycle slip detection and repairing method based on linear combination optimization

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0097] In this embodiment: the satellite navigation system is the Beidou system, and the four frequency points of the Beidou system correspond to its B1I, B1C, B2a and B3I respectively, and the frequencies of the frequency points B1I, B1C, B2a and B3I are respectively f 1 , f 2 , f 3 , f 4 . Using the four-frequency cycle-slip detection and repair method based on linear combination optimization provided by the present invention, four sets of cycle-slip detection linear combinations of the Beidou system and the corresponding four sets of cycle-slip detection linear combination detection quantities are constructed to restore the four frequency points of the Beidou system. cycle slip value.

[0098] 1) After linear combination optimization, the carrier coefficients (i, j, k, t) of the first group of cycle slip detection linear combination of the Beidou system are taken as (-1, 1, 0, 0), and the Beidou system is constructed according to formula (1) The first linear combination...

Embodiment 2

[0133] In the present embodiment, the satellite navigation system is the Galileo system, and the four frequency points of the Galileo system correspond to its E1, E5a, E5b and E6 respectively, and the frequencies of the frequency points E1, E5a, E5b and E6 are respectively f 1 , f 2 , f 3 , f 4 . Using the four-frequency cycle-slip detection and repair method based on linear combination optimization provided by the present invention, construct four sets of cycle-slip detection linear combinations of the Galileo system and corresponding four sets of cycle-slip detection linear combination detection quantities, and restore the four frequency points of the Galileo system. cycle slip value.

[0134] 1) After linear combination optimization, the carrier coefficients (i, j, k, t) of the first group of cycle slip detection linear combination of the Galileo system are taken as (0, -1, 1, 0), and the Galileo system is constructed according to the formula (1) The first linear combin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a four-frequency cycle slip detection and repairing method based on linear combination optimization. Four linear combinations are optimized for cycle slip detection and repairing with the maximum fixation probability as a target on basis of four-frequency observation data. Current cycle slip detection and repairing methods are mainly based on three-frequency observation values, and there is no cycle slip detection and repairing method based on four-frequency observation values. The four-frequency cycle slip detection and repairing method fills up the blank of cycle slipdetection and repairing based on four-frequency observation data and has great significance in giving full play to information redundancy brought by the four-frequency observation data and further improving the positioning accuracy.

Description

technical field [0001] The invention relates to the technical field of high-precision data processing of a satellite navigation system, in particular to a four-frequency cycle slip detection and repair method. Background technique [0002] The accuracy of carrier phase observation is much higher than that of pseudorange, and it has a wide range of applications in the field of high-precision data processing of satellite navigation systems. In the actual environment, due to interference, occlusion and other factors, the carrier phase will jump throughout the whole cycle, which is generally called cycle jump. The occurrence of cycle slips breaks the continuity of carrier phase, and cycle slip detection and repair must be performed before using carrier phase for high-precision positioning calculations. [0003] Current cycle slip detection and repair methods are mainly based on tri-frequency observation data. With the construction of the Beidou global system, Beidou can broadc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01S19/37
CPCG01S19/37
Inventor 张可王耀鼎刘文祥李峥嵘王飞雪楼生强刘增军李井源黄龙牟卫华
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products