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Test method and test system

A test method and test system technology, applied in image analysis, image enhancement, instruments, etc., can solve the problems that the calibrated parameters cannot accurately generate structured light images, and the calibration results of structured light equipment are not accurate enough, so as to avoid parameters that do not meet the requirements. Effect

Active Publication Date: 2020-01-24
GUANGDONG OPPO MOBILE TELECOMM CORP LTD
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  • Abstract
  • Description
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Problems solved by technology

[0002] After the structured light device is calibrated, it can generate structured light images according to the calibrated parameters. However, during the calibration process, the calibration results of the structured light device may not be accurate enough, or the working conditions of the structured light device itself may change before leaving the factory, resulting in The calibrated parameters cannot accurately generate structured light images, therefore, it is necessary to provide a scheme for further testing the parameters of structured light equipment

Method used

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Embodiment Construction

[0091] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0092] see Figure 1 to Figure 3 , the test method of the embodiment of the present invention is used to test the parameters of the structured light device 20, the structured light device 20 includes a depth camera 21, and the test method includes steps:

[0093] 01: Drive the structured light device 20 to move to the first test position relative to the calibration plate 16;

[0094] 02: Control the depth camera 21 to obtain the depth image of the calibration plate 16; and

[0095] 03: Determine whether the depth accuracy test ...

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Abstract

The invention discloses a test method. The test method is used for testing parameters of structured light equipment, wherein the structured light equipment comprises a depth camera, and the test method comprises the following steps: driving the structured light equipment to move to a first test position relative to a calibration plate; controlling a depth camera to obtain a depth image of the calibration plate; and judging whether the depth precision of the structured light equipment passes the test or not according to the depth image. The invention also discloses a test system. According to the test method and the test system provided by the embodiment of the invention, whether the depth precision of the structured light equipment passes the test can be judged according to the depth imageacquired by the depth camera of the structured light equipment, and the parameters of the structured light equipment can be tested before the structured light equipment leaves a factory, and the condition that the parameters of the outgoing structured light equipment do not meet the requirements is avoided.

Description

technical field [0001] The invention relates to the technical field of testing equipment, in particular to a testing method and a testing system. Background technique [0002] After the structured light device is calibrated, it can generate structured light images according to the calibrated parameters. However, during the calibration process, the calibration results of the structured light device may not be accurate enough, or the working conditions of the structured light device itself may change before leaving the factory, resulting in The calibrated parameters cannot accurately generate structured light images, therefore, it is necessary to provide a scheme for further testing the parameters of structured light devices. Contents of the invention [0003] Embodiments of the present invention provide a testing method and a testing system. [0004] The test method in the embodiment of the present invention is used to test the parameters of the structured light device, th...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/80G06T1/00
CPCG06T7/80G06T1/0007G06T2207/10028G06T2207/30168
Inventor 白剑
Owner GUANGDONG OPPO MOBILE TELECOMM CORP LTD