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Transparent smooth curved surface defect identification method and detection device

A technology for smooth surface and defect identification, applied in image data processing, instrumentation, computing, etc., can solve the problems of limited application scenarios, high cost of use, optimization, and maintenance

Active Publication Date: 2020-05-19
PKU HKUST SHENZHEN HONGKONG INSTITUTION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, some 3D detection methods involve foreign core technologies, and the cost of use, optimization and maintenance is high; some need to cooperate with high-precision scanning platforms or complex reconstruction algorithms, and the application scenarios are limited

Method used

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  • Transparent smooth curved surface defect identification method and detection device
  • Transparent smooth curved surface defect identification method and detection device
  • Transparent smooth curved surface defect identification method and detection device

Examples

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Embodiment Construction

[0021] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.

[0022] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.

[0023] A method for identifying defects on transparent and smooth curved surfaces provided by an embodiment of the present invention includes:

[0024] S110 Acquire the fringe parameters set for the lighting device, wherein the fringe parameters include a lighting area...

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Abstract

An embodiment of the invention provides a transparent smooth curved surface defect identification method, which comprises the following steps of: acquiring stripe parameters set for a lighting device,wherein the stripe parameters comprising a lighting region, a movement interval and a stripe period of the lighting device; sequentially lightening lighting regions of the lighting device according to the stripe parameters, the stripe period and the moving interval, and enabling light rays of the lighting regions to penetrate through the transparent smooth curved surface; acquiring an image thatthe light of the lighting region passes through the transparent smooth curved surface; and identifying the image that the light of the lighting region passes through the transparent smooth curved surface so as to determine whether the transparent smooth curved surface has defects or not. The embodiment of the invention further provides a detection device.

Description

technical field [0001] The invention belongs to the field of detection of transparent and smooth curved surfaces, in particular to a defect recognition method and detection device of transparent and smooth curved surfaces. Background technique [0002] In the modern mid-to-high-end manufacturing industry, important components with high added value made of glass and acrylic transparent and smooth materials are indispensable. For example, electronic glass covers for digital product display, or acrylic lenses for automotive lighting. In the production process of transparent and smooth components, due to certain limitations of the production process, or improper handling of the grasping process, appearance defects such as scratches, cracks, and black and white spots will inevitably appear on the surface. When defective components flow to end products inadvertently, it will increase the manufacturing cost of the product in disguise and weaken the market competitiveness of the pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
CPCG06T7/0008G06T2207/10141
Inventor 蒋仕龙陈方涵张晓梅
Owner PKU HKUST SHENZHEN HONGKONG INSTITUTION
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