Image-based defect detection method and computer readable storage medium

A defect detection and defect technology, which is applied in the field of image-based defect detection and computer-readable storage media, can solve the problems of unstable discrimination accuracy, failure to give category and grade judgment, and achieve the effect of accurate judgment

Active Publication Date: 2020-06-05
HENAN YUZHAN PRECISION TECH CO LTD
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, inspectors need to be trained for a long time before they can accurately judge the type and level of defects, and inspectors are easily affected by subjective consciousness, emotion, vision and fatigue, resulting in unstable judgment accuracy
Although the use of automatic optical inspection equipment (Automated Optical Inspection, AOI) to take images and detect defects based on image processing technology can reduce a lot of manpower input, but the traditional machine vision appearance inspection based on image processing technology is not suitable for small and changeable defects. , unable to give accurate category and grade judgment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Image-based defect detection method and computer readable storage medium
  • Image-based defect detection method and computer readable storage medium
  • Image-based defect detection method and computer readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] In order to more clearly understand the above objects, features and advantages of the present invention, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0054] Many specific details are set forth in the following description to facilitate a full understanding of the present invention, and the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0055] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an image-based defect detection method and a computer readable storage medium. The method is suitable for detecting appearance defects of an object to be detected. The image defect detection method comprises the following steps: acquiring at least one image of a to-be-detected object; extracting a plurality of target defect sub-regions from the image; judging defect typesof the plurality of target defect sub-regions by utilizing a first processing method; generating at least one target defect area from the plurality of target defect sub-areas by using a second processing method; judging a first defect level of the target defect area according to a first criterion; and storing the first defect level. According to the invention, a first processing method is used todetermine defect types of a plurality of target defect subareas extracted from an image of a to-be-detected object; and at least one target defect area is generated from the plurality of target defectsubareas by using a second processing method, and the first defect level of the target defect area is judged according to a first criterion, so as to judge the defects of the to-be-detected object.

Description

technical field [0001] The invention relates to an image-based defect detection method and a computer-readable storage medium. Background technique [0002] The current product manufacturing industry is developing towards high precision and high quality, which makes precision parts prone to various defects such as collisions, crushing, and abrasions after processing, and the size of the defects reaches the micron level. At present, a large amount of testing manpower is required to detect the above flaw. However, inspectors need to be trained for a long time before they can accurately judge the type and level of defects, and inspectors are easily affected by subjective consciousness, emotion, vision and fatigue, resulting in unstable judgment accuracy. Although the use of automatic optical inspection equipment (Automated Optical Inspection, AOI) to take images and detect defects based on image processing technology can reduce a lot of manpower input, but the traditional mach...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11
CPCG06T7/0004G06T7/11
Inventor 赵学兴王晟陈少斌陈昱廷
Owner HENAN YUZHAN PRECISION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products