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Testing device and method for high-speed link system

A high-speed link and testing device technology, applied in the field of communications, can solve problems such as low insertion loss and crosstalk testing accuracy, and achieve the effects of improving insertion loss and crosstalk testing efficiency, simplifying insertion loss and crosstalk testing steps, and improving insertion loss and crosstalk testing accuracy.

Active Publication Date: 2020-06-05
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention proposes a test device and method for a high-speed link system, which is used to solve the problem of low accuracy in the insertion loss and crosstalk test of high-speed transmission signals in the prior art

Method used

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  • Testing device and method for high-speed link system
  • Testing device and method for high-speed link system
  • Testing device and method for high-speed link system

Examples

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Effect test

no. 1 example

[0050] In the first embodiment of the present invention, a test device for a high-speed link system, such as figure 1 shown, including the following components:

[0051] Chip test device 100, transmission ISI (Insertion, insertion loss) attenuation test unit 200, crosstalk ISI attenuation device 300 and XTK (crosstalk, crosstalk) test unit 400;

[0052]The chip test device 100 is used to transmit the generated transmission test signal to the transmission ISI attenuation device 200, and transmit the generated crosstalk test signal to the crosstalk ISI attenuation device 300;

[0053] The transmission ISI attenuation device 200 is used to attenuate the received transmission test signal, and transmit the attenuated transmission test signal to the XTK test device 400;

[0054] The crosstalk ISI attenuation device 300 is used to attenuate the received crosstalk test signal, and transmit the attenuated crosstalk test signal to the XTK test device 400;

[0055] The XTK test device ...

no. 2 example

[0063] In the second embodiment of the present invention, a test device for a high-speed link system, such as figure 2 shown, including the following components:

[0064] Chip test device 100, transmission ISI attenuation device 200, crosstalk ISI attenuation device 300 and XTK test device 400;

[0065] The chip test device 100 is used to transmit the generated transmission test signal to the transmission ISI attenuation device 200, and transmit the generated crosstalk test signal to the crosstalk ISI attenuation device 300;

[0066] The transmission ISI attenuation device 200 is used to perform insertion loss gradient scanning on the received transmission test signal, so as to attenuate the transmission test signal through different insertion loss gradient channels, and transmit the attenuated transmission test signal to the XTK test device 400 ;

[0067] The crosstalk ISI attenuation device 300 is used to perform insertion loss gradient scanning on the received crosstalk ...

no. 3 example

[0122] In the third embodiment of the present invention, a test method for a high-speed link system, such as image 3 As shown, the test method includes the following steps:

[0123] Step S301 , attenuating the transmission test signal and the crosstalk test signal respectively according to preset test parameters.

[0124] Wherein, the test parameters include: an attenuation parameter of the transmission test signal, and an attenuation parameter of the crosstalk test signal.

[0125] In this embodiment, the attenuation parameter of the transmission test signal is not specifically limited. It may be to attenuate the transmission test signal to a set value, or to attenuate the transmission test signal to a set attenuation amplitude value, or to attenuate the transmission test signal to a set value. The attenuation amplitude value for the signal to undergo gradient attenuation.

[0126] In this embodiment, the attenuation parameter of the crosstalk test signal is not specifical...

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Abstract

The invention provides a testing device of a high-speed link system. The testing device comprises a chip testing device, a transmission insertion loss ISI attenuation device, a crosstalk ISI attenuation device and a crosstalk XTK testing device, wherein the XTK test device is used for forming a crosstalk signal from a received crosstalk test signal in a received transmission test signal and transmitting the transmission test signal carrying the crosstalk signal to the chip test device; and the chip testing device is also used for testing and evaluating the quality parameters of the transmission test signal carrying the crosstalk signal. The invention further discloses a test method of the high-speed link system, and by implementing the scheme, the quality parameter test evaluation precision of the transmission test signal bearing the crosstalk signal is effectively improved; and according to the invention, the step of testing and evaluating the quality parameter of the transmission test signal carrying the crosstalk signal is simplified, and the efficiency of testing and evaluating the quality parameter of the transmission test signal carrying the crosstalk signal is improved.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to a testing device and method for a high-speed link system. Background technique [0002] The switching capacity and processing capacity of modern communication systems are getting bigger and bigger, and the transmission rate of communication signals is getting higher and higher. The loss of communication signals directly affects the correct transmission of signals and affects the entire system. Designers must understand the loss of communication signals in order to make correct judgments and evaluations. [0003] In the prior art, the communication signal loss test is performed in the following two ways to evaluate the high-speed communication system: the first way is to measure the eye diagram of a communication signal of a rate under two different channels, and extract the amplitude parameters from the eye diagram, and then Add the absolute values ​​of the parameters ext...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/20H04B17/309H04L27/04
CPCH04B17/20H04B17/309H04L27/04
Inventor 刘春伟
Owner ZTE CORP
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