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Bounded wave simulator having three different electric field regions

A simulator, bounded wave technology, applied in the field of electromagnetism

Active Publication Date: 2020-06-23
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the disadvantage is that there is a contradiction between the upper limit of the usable frequency and the measurement size, which is limited to a quarter of the minimum operating wavelength, so it is only suitable for small devices such as chips

Method used

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  • Bounded wave simulator having three different electric field regions
  • Bounded wave simulator having three different electric field regions
  • Bounded wave simulator having three different electric field regions

Examples

Experimental program
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Embodiment Construction

[0038] Embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings.

[0039] Embodiments of the present disclosure are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present disclosure from the contents disclosed in this specification. Apparently, the described embodiments are only some of the embodiments of the present disclosure, not all of them. The present disclosure can also be implemented or applied through different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present disclosure. It should be noted that, in the case of no conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in the present disclosure, a...

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Abstract

The embodiment of the invention provides a bounded wave simulator having three different electric field areas, and belongs to the technical field of electromagnetism. The bounded wave simulator comprises a pulse signal generator, an electric field device and a terminal load. The electric field device is arranged at a transmitting port of the pulse signal generator; the electric field device comprises a first metal plate and a second metal plate, three electric field areas are sequentially formed between the first metal plate and the second metal plate when a power source is connected, the three electric field areas are arranged in a pulse signal transmission direction of the pulse signal generator, and plate distances corresponding to the three electric field areas are different; and the terminal load is arranged at an end portion, away from the pulse signal generator, of the electric field device and located in the pulse signal transmission direction of the pulse signal generator. Thus, by utilizing the three electric field areas with the different plate distances of the electric field device, different electric field intensities required by device testing can be realized, electric field intensity, a frequency and an amplitude of the bounded wave simulator are improved, and electric field performance of the bounded wave simulator is optimized.

Description

technical field [0001] The present disclosure relates to the field of electromagnetic technology, in particular to a bounded wave simulator with three different electric field regions. Background technique [0002] Electromagnetic Compatibility (Electro-Magnetic Compatibility, EMC) is a subject that studies the coexistence of various electrical equipment (including organisms in a broad sense) without causing degradation under the conditions of limited space, time, and spectrum resources. It includes electromagnetic interference and electromagnetic susceptibility. The electromagnetic interference test is to measure the electromagnetic wave signal generated and emitted by the equipment under test under normal working conditions to reflect the strength of the interference to the surrounding electronic equipment. The electromagnetic susceptibility test is to measure the anti-interference ability of the equipment under test to electromagnetic disturbance. [0003] With the rapid...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R29/08G01R1/28
CPCG01R1/28G01R29/0814G01R31/001
Inventor 何金良韩志飞杨光照胡军余占清张波
Owner TSINGHUA UNIV
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