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A method and circuit for measuring rsd time jitter

A technology of time jitter and measurement method, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve problems such as errors and achieve the effect of accurate RSD time jitter values

Active Publication Date: 2021-05-18
HUAZHONG UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Aiming at the defects of the prior art, the purpose of the present invention is to solve the technical problem that there is a relatively large error in the measurement of RSD time jitter in the prior art

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  • A method and circuit for measuring rsd time jitter
  • A method and circuit for measuring rsd time jitter
  • A method and circuit for measuring rsd time jitter

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Embodiment Construction

[0040] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0041] The invention discloses a test method for RSD time jitter, which is mainly used for testing the time jitter of RSD. The general time jitter measurement method measures the turn-on delay time of a single RSD multiple times and then calculates the standard deviation of these turn-on delay times to obtain the time jitter of the RSD. Since the measured RSD turn-on delay time also includes th...

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Abstract

The invention discloses a measurement method and circuit for RSD time jitter, comprising: two RSDs, a trigger circuit and a discharge circuit; the two RSDs are connected in parallel in two branches, and the two RSDs share one trigger circuit and one Discharge circuit; the two RSDs are of the same type; trigger two RSDs at the same time, and compare the preset positions of the rising edges of the output current pulses of the two RSDs to obtain the turn-on delay time difference of the RSDs; repeat triggering the two RSDs N times at the same time to obtain N RSDs The turn-on delay time difference of the N RSDs; the standard deviation of the turn-on delay time differences of the N RSDs is calculated, and finally the time jitter value of the RSD is obtained by using the standard deviation. In the present invention, since the two RSDs are in the same circuit, and the external working conditions are completely consistent, the obtained RSD turn-on delay time difference can almost remove the influence of external components, and can ensure that the obtained RSD time jitter value is more accurate.

Description

technical field [0001] The invention belongs to the technical field of power semiconductor device characteristic testing, and more specifically relates to a method and circuit for measuring RSD time jitter. Background technique [0002] Pulse power technology refers to the electrophysical technology that stores the stored energy for a long period of time, and then releases the stored energy to the load in a short period of time by turning on the device to generate high-power electric pulses. It is widely used in fields such as physical technology and sewage purification; the energy storage methods of pulse power generating circuits in the prior art are mostly capacitive energy storage and inductive energy storage. [0003] In pulse power systems, gas switches and liquid switches are commonly used, such as spark gaps, thyratrons, and oil-immersed switches. These switches have high withstand voltage and large flow, but their work is unstable, their lifespan is low, and their o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601G01R31/2607
Inventor 梁琳皮意成
Owner HUAZHONG UNIV OF SCI & TECH