Uncooled infrared focal plane array reading circuit

A focal plane array, uncooled infrared technology, applied in the field of infrared imaging, can solve the problems of the output voltage exceeding the dynamic range, the absolute value increase of the readout circuit response rate, etc.

Active Publication Date: 2020-10-27
HANGZHOU HIKMICRO SENSING TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, although the substrate temperature is strictly controlled, when the detector is at a high temperature, as the substrate temperature increases, the absolute value of the responsivity of the output of the readout circuit will increase, which in turn will cause the output voltage to exceed the dynamic range.

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  • Uncooled infrared focal plane array reading circuit
  • Uncooled infrared focal plane array reading circuit
  • Uncooled infrared focal plane array reading circuit

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Embodiment Construction

[0021] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with this specification. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present specification as recited in the appended claims.

[0022] The terms used in this specification are for the purpose of describing particular embodiments only, and are not intended to limit the specification. As used in this specification and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood that the t...

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Abstract

The invention provides an uncooled infrared focal plane array reading circuit. The reading circuit comprises an M*N array circuit and a mirror image circuit. The reading circuit further comprises a bias voltage generating device used for providing a dynamic bias voltage for the M*N array circuit and the mirror image circuit. The bias voltage generating device comprises a sensing resistor of whichthe resistance value linearly changes along with the change of the temperature of a substrate on the reading circuit, and a bias voltage generation module which is used for generating a dynamic bias voltage related to the resistance value according to a preset fixed bias voltage and the resistance value of the sensing resistor so as to provide the dynamic bias voltage to the pixels in the M*N array circuit and the two ends of a sensor resistor in the mirror image circuit. Therefore, the influence of the temperature change of the substrate on the output voltage responsivity of the reading circuit is reduced, and the problem that the output voltage of a uncooled infrared focal plane array detector exceeds a dynamic range at high temperature is avoided.

Description

technical field [0001] This specification relates to the field of infrared imaging technology, and in particular to an uncooled infrared focal plane array readout circuit. Background technique [0002] At present, uncooled infrared imaging technology has important applications in military, industrial and agricultural, medical, astronomical and other fields. As the core of the uncooled infrared imaging technology, the infrared focal plane array includes two parts: an infrared detector array and a readout circuit. Among them, the microbolometer focal plane array (FPA) has high sensitivity and is the most widely used uncooled infrared focal plane array. Its working principle is that the temperature of the heat-sensitive material changes after absorbing the incident infrared radiation, thereby It causes the change of its own resistance value, and detects the magnitude of the infrared radiation signal by measuring the change of its resistance value. [0003] Microbolometers gen...

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Application Information

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IPC IPC(8): G01J5/24
CPCG01J5/24G01J2005/0077G01J2005/202
Inventor刘俊何佳
OwnerHANGZHOU HIKMICRO SENSING TECH CO LTD