Boundary scanning test system and method

A boundary scan test and boundary scan technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as not applicable to production lines, achieve accurate coverage, save test resources, and clear the diagnosis process

Inactive Publication Date: 2021-03-09
INVENTEC PUDONG TECH CORPOARTION +2
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the size of the CPU test card needs to be consistent with the size of the original CPU, in the process of designing the CPU test card, it is necessary to face the challenge of how to configure the test resources of thousands of pins to be tested under the size of the original CPU
[0004] Therefore, the CPU test cards currently on the market generally adopt a multi-chip design. Each test card only covers a part of the pins of the CPU slot. During the test, the test cards need to be replaced and tested one by one, and then the test results of multiple chips are combined Output test reports, but this method has problems such as time cost, test fixture design, and test process control caused by frequent replacement of test cards, and is not suitable for production lines

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Boundary scanning test system and method
  • Boundary scanning test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The implementation of the present invention will be described in detail below in conjunction with the drawings and examples, so that the realization process of how to use technical means to solve technical problems and achieve technical effects in the present invention can be fully understood and implemented accordingly.

[0026] Please see first figure 1 , figure 1 It is a structural schematic diagram of an embodiment of the boundary scan test system of the present invention. In this embodiment, the boundary-scan testing system can be used to perform boundary-scan testing on the motherboard 50 to be tested. The motherboard 50 to be tested can include a plurality of central processing unit (Central Processing Unit, CPU) slots 52 and a plurality of dual in-line A plug-in memory module (Dual In-Line Memory Modules, DIMM) slot 54, the CPU slots 52 are connected through a plurality of Quick Path Interconnect (Quick Path Interconnect, QPI) lines, the CPU slot 52 is connecte...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a boundary scanning test system and method. Two ends of a first loopback line of each CPU (Central Processing Unit) test card are respectively connected with a boundary scanning unit of the other CPU test card and a boundary scanning unit of a dual in-line memory module (DIMM) test card; the two ends of the second loopback line of each CPU test card are respectively connected with the boundary scanning units of one DIMM test card to generate a plurality of boundary scanning line networks; the test control host can execute a diagnosis program, so that in each boundary scanning line network, one boundary scanning unit is selected randomly to send out an excitation signal, and the other boundary scanning units receive corresponding response signals and compare each response signal in each boundary scanning line network with the corresponding expected signal so as to output a diagnosis result of each boundary scanning line net.

Description

technical field [0001] The invention relates to a test system and its method, especially a boundary scan test system and its method. Background technique [0002] In the server motherboard production line, the original CPU of the motherboard is used for boundary scan testing. Every time a motherboard is tested, the CPU must be plugged and unplugged. A large number of tests will cause damage to the CPU, making the CPU a test consumable. Since the original CPU of the motherboard is expensive, there is a problem of high testing cost. [0003] In view of this, the relevant industry has begun to develop CPU test cards according to the actual needs of the production line. However, since the size of the CPU test card needs to be the same as that of the original CPU, in the process of designing the CPU test card, it is necessary to face the challenge of how to allocate test resources with thousands of pins to be tested under the size of the original CPU. [0004] Therefore, the C...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & AuthorityApplications(China)
IPC IPC(8): G01R31/3185
CPCG01R31/31855G01R31/318538G01R31/318583G06F13/4027G01R31/318536G01R31/3177
Inventor穆常青
OwnerINVENTEC PUDONG TECH CORPOARTION