This invention provides an IGBT testing line, comprising a testing
machine and a first side thereof, sequentially arranged from one end to the other, a loading and unloading mechanism, a front multi-
functional testing area, a preheating plate, and a front testing module. The first side of the testing
machine also sequentially arranges a rear testing module, a rear multi-
functional testing area, and a multi-layer
material distribution mechanism, with the rear testing module symmetrically arranged to the front, rear, and front multi-
functional testing areas. A fast passage is provided between the front and rear multi-functional testing areas. The second side of the testing
machine sequentially arranges a cooling plate and an arch testing module.
Material transport or skip-
station testing on the entire line is completed by a handling arm. The IGBT testing line of this invention requires only
software operation and can quickly achieve skip-
station testing without requiring personnel to modify the equipment, and does not affect production efficiency.