Double-line serial port build-in self-test circuit, and communication method thereof

Abstract

The invention discloses a double-line serial port build-in self-test circuit used for testing a memory. The double-line serial port build-in self-test circuit comprises a port module; the port module is used for parallel transmitting of data and read-write control signals sent by a tester to a control module; a reset line is used for receiving reset signals and realizing circuit initialization resetting, and an enable wire is used for outputting of testing enable signals for an enable testing circuit; a double-line serial bus comprises a clock line and a data line; the control module comprises an ID register, a state register, a command register, and a test register; the control module is controlled by the clock line and the reset line, is provided with an external clock line to receive external clock, and is used for sending control signals to a circuit under test. The invention also discloses a communication method used for testing the memory by using the build-in self-test circuit. The build-in self-test circuit of the invention is capable of saving test resources. The communication method is capable of reducing time occupied by a test communication line and test instruction communication, increasing test efficiency, and reducing waste of test resources.

Description

technical field [0001] The invention relates to the field of integrated circuit manufacturing, in particular to a two-wire serial port built-in self-test circuit for testing memory. The invention also relates to a communication method for testing the memory by using the built-in self-test circuit of the two-wire serial port. Background technique [0002] The test function of the integrated circuit built-in self-test circuit (BIST) is that the external tester sends a test sequence (that is, a test command) through the serial port, and through the internal decoding of the built-in self-test circuit, it becomes a control signal for the circuit under test. sequence, and then the corresponding functions are automatically executed by the test circuit. The test check is done internally, and the communication with the outside is done through the serial port, and there are very few external pins. [0003] In the existing built-in self-test circuit system, the communication between ...

AI Technical Summary

Problems solved by technology

In addition, most of the commands of the existing built-in self-test circuit adopt a mode of unequal length in order to compress the length of the command, which causes a lot of inconvenience in use.

[0004] When reading and writing memory, because of the operation time, some existing product designs need to issue two instructions to read and write, otherwise there will be extra time waiting for execution in the instruction

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