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Probe card device and directional probe thereof

A probe card and directional technology, applied in the field of probe cards, can solve problems such as hindering the research and development and progress of probe card devices.

Active Publication Date: 2021-08-06
CHUNGHWA PRECISION TEST TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the cooperation structure between the above-mentioned conductive needle body and the insulating layer of the existing conductive probes has been established for many years, thus virtually hindering the further development and progress of the existing probe card devices

Method used

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  • Probe card device and directional probe thereof
  • Probe card device and directional probe thereof
  • Probe card device and directional probe thereof

Examples

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Comparison scheme
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Embodiment Construction

[0026] The following is an illustration of the implementation of the "probe card device and its directional probe" disclosed in the present invention through specific specific examples. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only for simple illustration, and are not drawn according to the actual size, which is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present inventio...

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Abstract

The invention discloses a probe card device and a directional probe thereof. The directional probe is elongated and comprises a conductive probe body and an annular insulator. The conductive probe body comprises a stroke section and two tail end sections extending from the two ends of the stroke section respectively. The stroke section comprises two wide side faces and two narrow side faces, and a transverse groove extending from one of the two narrow side faces to the other of the two narrow side faces is concavely formed in only one wide side face. The maximum depth of the transverse groove is 1% to 10% of the maximum distance between the two wide side faces. The two tail end sections of the directional probe can be stressed to enable the stroke section to be in a bent shape, and the formed inflection point is located in the transverse groove. Therefore, the bending parts of the directional probes can be concentrated on the parts where the transverse grooves are formed when the directional probes act, the consistency of the acting directions can be effectively controlled, and each directional probe can independently work and does not interfere with each other in the testing process.

Description

technical field [0001] The invention relates to a probe card, in particular to a probe card device and a directional probe. Background technique [0002] The conductive probe of the existing probe card device includes a conductive needle body and an insulating layer formed at the center of the conductive needle body, and the width and thickness of the conductive needle body are approximately the same, so the above-mentioned insulating layer is in the shape of prominent shape. However, the cooperation structure between the above-mentioned conductive needle body and the insulating layer of the existing conductive probes has been established for a long time, thus virtually hindering the further development and progress of the existing probe card device. [0003] Therefore, the inventor believes that the above-mentioned defects can be improved, Naite devoted himself to research and combined with the application of scientific principles, and finally proposed an invention with re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067G01R1/073
CPCG01R1/06733G01R1/07307
Inventor 李文聪魏逊泰谢开杰苏伟志
Owner CHUNGHWA PRECISION TEST TECH