Electromagnetic wave measuring apparatus and method

A technology of measuring device and measuring method, applied in the direction of measuring device, measuring electrical variables, electromagnetic field characteristics, etc., can solve problems such as multi-scanning time, poor insulation, and inability to detect electromagnetic field distribution.

Inactive Publication Date: 2004-09-01
PANASONIC CORP
View PDF1 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the above-mentioned existing adjacent electromagnetic field distribution measuring devices, the various types of small annular elements are arranged in 2 dimensions, which cannot detect the original 3-dimensional electromagnetic field distribution, and the measurement accuracy is low.
[0008] Furthermore, the aforementioned sequential selection device requires a lot of scanning time in order to sequentially select and process the micro ring elements arranged in a two-dimensional grid.
There is also a problem that high-frequency (eg 2 GHz) sensitivity characteristics and insulation between small ring elements are degraded due to the influence of capacitance between switching diode terminals and frequency characteristics of transmission lines
[0009] The above-mentioned parallel detection type device processes the signals of a plurality of small ring elements in parallel at one time, which has the advantage of shortening the scanning time, but each small ring element needs a detection part, so the cost is high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electromagnetic wave measuring apparatus and method
  • Electromagnetic wave measuring apparatus and method
  • Electromagnetic wave measuring apparatus and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0048] The electromagnetic wave measuring device of Example 1 will be described with reference to FIG. 1. Fig. 1 is a perspective view showing a schematic configuration of the electromagnetic wave measuring device. This electromagnetic wave measuring device measures the nearby electromagnetic field distribution radiated from the object to be measured. In the following description, a mobile phone is described as the object to be measured HP.

[0049] In FIG. 1, the electromagnetic wave measuring device has an electromagnetic detection unit 1, a large electromagnetic field detection unit 2, an arithmetic processing unit 3, a stage drive unit 4, an XY stage 5, and a support unit 6. The object HP measured by the electromagnetic wave measuring device is mounted on the table top of the XY stage 5. In the following description, assume that the table surface of the XY stage 5 carrying the object HP is the XY plane, and the short axis direction of the object HP is placed in the X-axis dire...

Embodiment 2

[0087] The electromagnetic wave measuring device of Example 2 will be described. This electromagnetic wave measuring device measures a wide range of adjacent electromagnetic field distribution with a minimum magnetic field detection probe and an electromagnetic field level detection unit, and reduces the range of the moving object to achieve miniaturization of the drive system. The composition of the electromagnetic wave measuring device of the second embodiment is the same as that of the electromagnetic wave measuring device of the first embodiment described with reference to FIG. 1, so detailed description is omitted. The electromagnetic field level detection section 2 and the calculation processing section 3 of the electromagnetic wave measuring device of the second embodiment are also the same as the electromagnetic field level detection section 2 and the calculation processing section 3 of the first embodiment described in FIG. 4, so detailed descriptions are omitted. .

[00...

Embodiment 3

[0126] The electromagnetic wave measuring device of Example 3 will be described. This electromagnetic wave measuring device uses a high-precision magnetic field detection probe to measure the high-precision and large-range nearby electromagnetic field distribution, and seeks to miniaturize the drive system by reducing the range of movement of the object to be measured. The composition of the electromagnetic wave measuring device of the third embodiment is the same as that of the electromagnetic wave measuring device of the first embodiment described with reference to FIG. 1, so detailed description is omitted. The composition of the electromagnetic field level detection section 2 and the calculation processing section 3 of the electromagnetic wave measuring device of the third embodiment is also the same as that of the electromagnetic field level detection section 2 and the calculation processing section 3 of the first embodiment described in FIG. 4, and detailed descriptions are ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An electromagnetic wave measuring apparatus includes a loop probe section having loop probes 11a to 11c whose loop planes are placed so as to be perpendicular to each other, and each loop probe is placed so that its magnetic field detection space is not interfered with by other loop probes. If the loop probe section is placed at measurement position coordinates xi, yj, it detects a magnetic field component at the measurement position coordinates xi, yj, which is parallel to an XY plane, and a magnetic field component in a Z-axis direction at measurement position coordinates xi, yj-1, and repeats measurement by pitch p in a positive Y-axis direction. By calculating the root sum square of the detection results at each measurement position coordinate, a three-dimensional magnetic field level of an object to be measured can be obtained at each measurement position coordinate as electromagnetic field distribution with high-precision.

Description

Invention field [0001] The present invention relates to an electromagnetic wave measuring device and a measuring method thereof for measuring electromagnetic waves radiated by electronic components, and in particular to an electromagnetic wave measuring device and a measuring method thereof for measuring the adjacent electromagnetic field distribution of electromagnetic waves radiated to portable wireless devices such as portable phones. Background technique [0002] In recent years, portable wireless devices such as mobile phones have rapidly spread on a global scale. On the other hand, exposure to electromagnetic fields from portable wireless devices used close to the human body is being managed by electromagnetic waves in the context of biological protection. [0003] In the past, a parallel detection type has been known as a device for measuring the distribution of adjacent electromagnetic fields radiated by electronic devices such as portable wireless devices. For example, t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08H04B7/26
CPCG01R29/0871G01R29/0814
Inventor 梶原正一尾崎晃弘小川晃一小柳芳雄浅山叔孝斋藤裕
Owner PANASONIC CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products