Method for simulating data flow flash

Abstract

This invention relates to a method for imitating data flow cutoff, applying logical chip system with imitating data flow cutoff function. It comprises the following steps: A, the logical chip will transfer the data flow between data resource and rear circuit, deciding whether it reach to cutoff space, if it is, go to step B; if not, go on step A; B, knocking off the data flow, deciding whether it reach to the cutoff time according to the transmitted signal, if it is, return to step A; if not, go on step B; C, closing the test, blinding the cutoff function. Said invention can realize imitating data flow cutoff with various speed and interface on line, and control the type, time and space of the cutoff precisely.

Description

technical field [0001] The invention relates to a method for controlling data stream transmission in electronic technology, in particular to a method for simulating the intermittent interruption of data streams. Background technique [0002] Data flow is the form of information transmission in electronic technology, and the level characteristics and encoding methods are related to specific applications. During data streaming, "flicker" may occur. For example, the random interruption and recovery of data streams lead to abnormal information transmission, which is called "flash" in the field of communication technology; the transmission of TV video signals is sometimes interrupted instantaneously or temporarily, which is called "flash" in the field of radio frequency reception technology. Also known as "flash". Interruptions can be caused by various factors, among others, environmental factors such as lightning or climate change, building interference, electrical or electron...

AI Technical Summary

Problems solved by technology

[0009] 1. For communication systems in practical applications, sometimes it is necessary to simulate data flow flashes for performance testing, but in the prior art testing, external testing instruments must be connected, and online testing cannot be performed

Since the external test instrument means that the original link needs to be interrupted and then connected to the test instrument, this will inevitably lead to business interruption

[0010] 2. Because the test instruments are designed for specific services such as Synchronous Digital Hierarchy (SDH, Synchronous Digital Hierarchy), Plesiochronous Digital Hierarchy (PDH, Plesiochronous Digital Hierarchy), etc., the International Telecommunications Union (ITU-T, International Telecommunications Union), the United States The National Standardization Organization (ANSI, America National Standard Institution) and the national standard have strict definitions for specific services in terms of speed, interface, and noise performance, so the test instrument is standard in terms of speed, interface, etc., and the flash function of the test instrument is also It can only be realized in the fixed service defined by the standard

For some custom non-standard interfaces or infrequently used standard interfaces and the data rate of the on-board interface is non-standard, the test instrument cannot support it, and the flash function cannot be tested

[0011] 3. Due to the high cost and small quantity of testing instruments, it is not conducive to the promotion of the method of simulating data stream flashing, and cannot effectively test the performance of products and systems

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