Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Non-refrigeration infrared focus plane non-uniform correcting algorithm based on Wiener filter theory

An uncooled infrared and non-uniform correction technology, applied in the correction field of uncooled infrared focal plane imaging system, can solve the problems of large amount of calculation, unsatisfactory correction effect, difficult real-time performance, etc.

Inactive Publication Date: 2009-02-04
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although many kinds of correction algorithms have been proposed, they are either too simple and the correction effect is not ideal (such as two-point correction), or they are too complex and have a large amount of calculation to achieve real-time performance, so they all have some shortcomings.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Non-refrigeration infrared focus plane non-uniform correcting algorithm based on Wiener filter theory
  • Non-refrigeration infrared focus plane non-uniform correcting algorithm based on Wiener filter theory
  • Non-refrigeration infrared focus plane non-uniform correcting algorithm based on Wiener filter theory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The following uses a dedicated digital digital signal processing chip PDSP16256 as an example to briefly explain its use.

[0040] The dedicated DSP chip PDSP16256, its crystal frequency F is 40MHz, and the data throughput rate is 40M2 m , (Where m is a coefficient related to the order). The number is 12 bits long, the input data word length is 16 bits (corresponding to the number of AD conversion bits), the output data word length is 32 bits, and the learned coefficients are stored in EPROM. Since the dedicated DSP chip has a very high data throughput rate compared to the general DSP, the structure has good real-time performance and can meet the requirements of practicality. The structure of this part is attached figure 2 Shown.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The disclosed correction algorithm based on Wiener filtering theory from in-depth analysis of random signal process theory. Under support of modern signal process technique (mainly, adaptive filtering technique), a structure of digital filter is constructed. The invention applies analysis of filter structure to issue of non-uniform correction of not refrigerative infrared focal plane. Advantages are: higher correction accuracy in real-time.

Description

Technical field [0001] The present invention relates to the correction technology of an uncooled infrared focal plane imaging system (IRFPA), in particular to the non-uniform correction technology of an uncooled infrared focal plane imaging system. Background technique [0002] For any object with a temperature above 0K, the molecules and atoms that make up the object are in vibration and rotation, and release electromagnetic waves to the outside space. Targets at different temperatures have different radiation wave strengths. The weak infrared rays are measured, and the objects are identified according to the intensity of the infrared rays to form an image. This is the principle of the uncooled infrared focal plane imaging system. [0003] The number of pixels is a key indicator of image quality. To get a clear image effect, an imaging array composed of many detection elements is needed. Due to technological reasons, the output results of each detector for the same intensity of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J1/02
Inventor 蒋亚东甄德根吴志明
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products