A single-pulse method for measuring nonlinear refraction of materials

A nonlinear, single-pulse technology, applied in the field of optical nonlinear refraction measurement of materials, can solve the problems of increased measurement cost, high CCD requirements, complex processing, etc., to achieve reduced measurement costs, simple optical path requirements, and simple theoretical models Effect

Active Publication Date: 2012-02-15
SUZHOU MICRONANO LASER PHOTON TECH CO LTD
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Problems solved by technology

However, this method requires complex processing of the collected images, the detector needs to use CCD, and the requirements for CCD are relatively high, which increases the cost of measurement

Method used

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  • A single-pulse method for measuring nonlinear refraction of materials
  • A single-pulse method for measuring nonlinear refraction of materials
  • A single-pulse method for measuring nonlinear refraction of materials

Examples

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Embodiment 1

[0025] Embodiment one: see attached figure 2 As shown, a device containing a single pulse of a phase object to measure the nonlinear parameters of a functional material is composed of a beam splitter 2, a phase object 4, a convex lens 5, a small hole 7, a detector 3 and a second detector 8; Pulse 1 is focused on the sample 6 to be tested.

[0026] A beam splitter 2 is used to split the laser pulse 1 into two beams of light. The energy of the monitoring light is received by the detector 3. The other beam of light passes through the phase object 4 and is focused onto the sample 6 by the convex lens 5. The transmitted beam passes through the The small hole 7 is then received by the detector 8 .

[0027] In this embodiment, the laser beam is a 532nm laser after frequency doubling by a Nd:YAG laser (Ekspla, PL2143B), with a pulse width of 21 ps. The two detectors of the model (Rjp-765 energy probe) are connected to the energy meter (Rj-7620 ENERGY RATIOMETER, Laserprobe). The s...

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Abstract

The invention discloses a method for measuring the nonlinear refraction of a material with a single pulse. A phase object is added in the detection optical path. Under the action of a single pulse, the nonlinear transmittance of a small hole in the far field can be measured to determine the nonlinear refraction of the material. Linear index of refraction. The measurement system working according to the method of the invention has the advantages of simple optical path, simple data processing, single pulse measurement, no need to move the sample, can measure the magnitude and sign of nonlinear refraction at the same time, accurate measurement results, and greatly reduce the measurement cost.

Description

technical field [0001] The invention relates to a method for measuring optical nonlinear refraction of materials, belonging to the fields of nonlinear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. [0003] Optical nonlinear measurement technology is one of the key technologies for studying nonlinear optical materials. Commonly used measurement methods include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferometry, four-wave mixing, third harmonic nonlinear interferometry, ellipsometry, phase object Z-scan, etc....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/41
Inventor 宋瑛林杨俊义金肖税敏李常伟
Owner SUZHOU MICRONANO LASER PHOTON TECH CO LTD
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