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Test tray for test handler

A technology for testing trays and manipulators, which is applied in the direction of single semiconductor device testing, measuring electricity, and measuring devices, and can solve problems such as cost, large fixed structure space, number of components, and increased working time

Active Publication Date: 2009-09-16
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the conventional test tray is constructed in such a way that the plug-in modules are fastened to the frame with screws at both ends thereof in the longitudinal direction, it has a structural disadvantage in that it takes a lot of space for a corresponding fastening structure.
[0006] In addition, since the conventional test tray mounts one plug-in module to the frame using two fixing units (for example, screws), the number of parts and work time increase

Method used

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  • Test tray for test handler
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Examples

Experimental program
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Embodiment Construction

[0027] Preferred embodiments of a test tray of a test robot according to the present invention will be described in detail with reference to the accompanying drawings.

[0028] figure 2 is an exploded perspective view of a portion of a test tray for testing a manipulator according to an embodiment of the present invention.

[0029] refer to figure 2 , the test tray TT is configured to include a frame 20 , a plurality of plug-in modules 30 and screws 40 .

[0030] Such as image 3 As shown as a whole, the frame 20 includes: an outer body 21, which is rectangular in shape, and defines the periphery of the frame 20; longitudinal middle beams 22, spaced apart from each other at specific intervals in the transverse direction, and joined to the outer body 21 along the longitudinal direction; The intermediate beams 23, spaced apart from each other at predetermined intervals in the longitudinal direction, are joined to the outer body 21 in the transverse direction. It should be ...

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Abstract

A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.

Description

technical field [0001] The present invention relates to a test manipulator, and more particularly, to a test tray loaded with semiconductor devices and then carrying the semiconductor devices along a predetermined circulation path in the test manipulator. Background technique [0002] In the field of semiconductor equipment, a test manipulator is also called an automatic test equipment, which allows a detector to test semiconductor devices according to a predetermined test process and sort the tested semiconductor devices, thereby providing semiconductor devices with good quality. The test manipulator is configured to include a plurality of test trays loaded with semiconductor devices and moved in the manipulator in a predetermined cycle. While the test trays are moving on the endless path, they are docked with the detectors so that the detectors can test the semiconductor devices. [0003] Each test tray is configured to include a frame and plug-in modules arranged in a ma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2893G01R31/26H01L21/67
Inventor 沈裁均罗闰成全寅九具泰兴黄正佑
Owner TECHWING CO LTD