Flash memory device and associated method of operation using an adaptive programming verification scheme

A device and storage unit technology, applied in the field of semiconductor storage devices, can solve problems such as low storage capacity

Active Publication Date: 2016-05-11
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Compared with NAND flash memory, NOR flash memory can provide faster access speed, but has lower storage capacity

Method used

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  • Flash memory device and associated method of operation using an adaptive programming verification scheme
  • Flash memory device and associated method of operation using an adaptive programming verification scheme
  • Flash memory device and associated method of operation using an adaptive programming verification scheme

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Embodiment Construction

[0053] Embodiments of the principles of the present invention are described below with reference to the accompanying drawings. These embodiments are provided as teaching examples and should not be construed as limiting the scope of the principles of the invention.

[0054] In the following description, when a first feature is said to be "connected to" a second feature, the first feature may be "directly connected to" the second feature, or "electrically connected" to the second feature via intermediate features. The terms of a singular form include plural forms unless the context indicates otherwise. The terms "comprising", "comprising" refer to the presence of certain features without excluding other features.

[0055] figure 1 is a block diagram illustrating a flash memory device according to an embodiment of the principles of the invention. For illustrative purposes, assume figure 1 The flash memory device is a NAND flash memory device. However, embodiments of the pres...

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Abstract

A method of programming a flash memory device comprises programming selected memory cells, performing a verification operation to determine whether the selected memory cells have reached a target program state, and determining a start point of the verification operation based on a programming characteristic associated with a detection of a pass bit during programming of an initial program state.

Description

[0001] This application claims priority to Korean Patent Application No. 10-2010-0012894 filed on February 11, 2010 under 35 U.S.C. §119, the disclosure of which is incorporated herein by reference. technical field [0002] Embodiments of the present principles relate generally to semiconductor memory devices. More particularly, embodiments of the present principles relate to flash memory devices and associated methods of operation using adaptive program verification schemes. Background technique [0003] Semiconductor memory plays an important role in many modern electronic devices from satellites to consumer products. Therefore, advances in semiconductor memory technology can lead to significant improvements in a large number of technological applications. [0004] Semiconductor memory devices can be roughly divided into two categories according to whether stored data is maintained when power is turned off. The category includes volatile semiconductor memory devices, whi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C16/34
CPCG11C16/3454G11C16/3459G11C16/08G11C16/10G11C16/34G11C11/56G11C11/5671
Inventor 尹翔镛尹铉竣金甫根朴起台金武星
Owner SAMSUNG ELECTRONICS CO LTD
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