Electronic product failure analysis method

Abstract

The invention provides an electronic product failure analysis method. The method comprises the following steps of: acquiring failure information of a failed electronic product from a storage device; performing failure copy verification according to the acquired failure information in order to verify whether a failure phenomenon corresponding to the acquired failure information can be copied; when the failure phenomenon corresponding to the acquired failure information cannot be copied, testing the failed electronic product to judge whether a failure reason of the failed electronic product belongs to an irreproducible problem; and when the failed electronic product does not have the irreproducible problem, judging whether the failed electronic product does not break down.

Description

technical field [0001] The invention relates to a method for processing multi-category data in an electronic business information database system. Background technique [0002] During the production process and use process of the product, the loss of the specified function of the product is called failure. The technical and management activities of judging the failure mode of the failed product, finding the cause and mechanism of failure, and proposing countermeasures to prevent re-failure are called failure analysis. [0003] At present, the failure analysis methods for electronic products are not perfect, and there is no unified failure analysis method. For example, when engineers perform failure analysis on failed electronic products, they only perform CND (can not duplicate, cannot be copied) problem judgments or NTF (no trouble found , no failure) judgment. In fact, CND and NTF are two different problems. This single test method makes failure analysis loopholes and re...

AI Technical Summary

Problems solved by technology

[0003] At present, the failure analysis methods for electronic products are not perfect, and there is no unified failure analysis method. For example, when engineers perform failure analysis on failed electronic products, they only perform CND (can not duplicate, cannot be copied) problem judgments or NTF (no trouble found , no failure) judgment

In fact, CND and NTF are two different problems, this single test method makes failure analysis loopholes and reduces the quality of electronic products

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