Radio frequency and microwave synthetic instrument based on PXIe (PCI Extensions for Instrumentation) synthetic instrument architecture

Abstract

The invention discloses a radio frequency and microwave synthetic instrument based on a PXIe (PCI Extensions for Instrumentation) synthetic instrument architecture. A control platform accesses to a PXIe bus through a PXIe system controller; a digitizer module, a signal generator module, a down-conversion module, a down-conversion local oscillator, an up-conversion module and an up-conversion local oscillator all access to the PXIe bus; signal line direct channels are respectively arranged between a synthetic instrument hardware interface and the digitizer module and between the synthetic instrument hardware interface and the signal generator module; the down-conversion module is connected with the down-conversion local oscillator and the digitizer module, and the up-conversion module is connected with the up-conversion local oscillator and the signal generator module; the down-conversion module and the up-conversion module are connected with the synthetic instrument hardware interface; and the control platform can enable the synthetic instrument to have different functions through configurations. The synthetic instrument provided by the invention can be used for realizing the miniaturization of a communication / radar electronic equipment test system by sharing a processing module and can meet the requirements of a new generation of automatic test systems.

Description

technical field [0001] The invention relates to the technical field of radio frequency / microwave instruments, in particular to a radio frequency and microwave comprehensive instrument based on a PXIe synthetic instrument framework. Background technique [0002] The biggest problem in today's automatic test system is not to absorb advanced technology in the newly equipped automatic test system to achieve higher test performance, but to manage the life cycle of existing and new automatic test systems for more than 20 years or longer question. [0003] Renewal and management of weapon systems prolongs the lifetime of weapon systems, which may be 20 years or more, requiring automated test systems that can also sustain them over such a long period of time. Costs for ongoing obsolescence management issues for weapons systems are relatively assured, but it is much more difficult to provide significant costs for existing test systems. Therefore, future automated test system obsole...

AI Technical Summary

Problems solved by technology

[0004] At present, domestic automatic test systems and foreign early automatic test systems use a large number of specially designed circuits to complete the test support work of weapon systems. Difficult and increasingly expensive to repair

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