Phase-locked loop resistant to single particle transient state

An anti-single event and phase-locked loop technology, applied in the field of phase-locked loops, can solve the problems of short single-event transient pulse time, difficult implementation, and loss of lock.

Active Publication Date: 2013-03-20
NO 771 INST OF NO 9 RES INST CHINA AEROSPACE SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method is difficult to implement, because the single event transient pulse time is very short, tens of picoseconds to hundreds of picoseconds, and the gate dela

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  • Phase-locked loop resistant to single particle transient state
  • Phase-locked loop resistant to single particle transient state
  • Phase-locked loop resistant to single particle transient state

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Embodiment Construction

[0029] The present invention will be further described in detail below in conjunction with specific embodiments, which are explanations of the present invention rather than limitations.

[0030] The anti-single event transient phase-locked loop proposed by the present invention is based on the following analysis:

[0031] First, the sensitivity of the charge-pump phase-locked loop to single-event transients is analyzed. Such as figure 1 The charge pump phase-locked loop system with a typical structure shown includes frequency and phase detectors and frequency dividers in the digital part, charge pumps, voltage-controlled oscillators and passive filter circuits in the analog part. The anti-single event transient of digital circuits has been deeply studied, and many research results can be directly applied to the frequency detector and frequency divider in the phase-locked loop; for the voltage-controlled oscillator, its oscillation requires a large drive current, Therefore, t...

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Abstract

The invention discloses a phase-locked loop resistant to a single particle transient state. The phase-locked loop comprises a phase frequency detector, a charge pump, a filter, a voltage-controlled oscillator and a frequency divider. A single particle suppression circuit is arranged between the charge pump and the filter and comprises a charge discharge branch, decay resistor, and a charge compensation branch. One end of the damping resistor is connected with an output end of the charge pump, and the other end of the damping resistor is connected with an input end of the voltage-controlled oscillator. When voltage of the output end of the charge pump is reduced and charging is needed, the filter charges the output end of the charge pump through the single particle suppression circuit. When the voltage of the output end of the charge pump rises and discharging is needed, the output end of the charge pump charges the filter through the single particle suppression circuit. Due to the fact that the single particle suppression circuit is arranged between the charge pump and the filter of the phase-locked loop, when receiving single particle bombardment, the output end of the charge pump discharges or be charged so as to reduce voltage disturbance caused on the input end of the voltage-controlled oscillator.

Description

technical field [0001] The invention belongs to the technical field of semiconductor integrated circuits, and relates to a single-event transient-resistant phase-locked loop. Background technique [0002] With the wide application of integrated circuits in space technology, more and more attention has been paid to their ability to resist single event transients, and the correctness of the output clock of the phase-locked loop as a clock generation module directly determines whether the electronic system can Therefore, for electronic systems working in radiation environments, the ability of phase-locked loops to resist single-event transients becomes a key technical indicator. [0003] At present, the industry has carried out extensive research on the anti-single event transient characteristics of phase-locked loops and achieved fruitful research results. For example, the article "A hardened-by-design technique for RF digital phase-locked loops" proposes a voltage-type charg...

Claims

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Application Information

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IPC IPC(8): H03L7/085H03L7/18
Inventor 韩本光郭仲杰汪西虎吴龙胜
Owner NO 771 INST OF NO 9 RES INST CHINA AEROSPACE SCI & TECH
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