A kind of control method of bus structure data acquisition device supporting hot swap

Abstract

The invention provides a control method for a bus structured data acquisition unit supporting hot swapping and is applied to the data acquisition unit. The data acquisition unit comprises a main control unit and a back plate unit, wherein the back plate unit is provided with a slot for inserting of a module card. The control method includes: A1, configuring response modes during a hot swapping operation of the module card; and A2, executing corresponding response operations according to the response modes when the hot swapping operation is performed on the module card. By means of the control method, corresponding response operations can be executed according to the response modes when the hot swapping operation is performed on the module card, hot swapping follow-up processing operations can be controlled reasonably according to needs of users, short circuit with to-be-tested circuits connected outside the data acquisition unit caused by direct and automatic reboot of systems can be avoided, potential risks are eliminated, and the timely recovery capability of the data acquisition unit in work breakdowns is improved.

Description

technical field [0001] The invention relates to the technical field of measurement and testing, in particular to a control method of a bus structure data acquisition device supporting hot plugging. Background technique [0002] Data acquisition device refers to a device that automatically collects information from sensors and other measured objects. It can realize the acquisition of various signals. By connecting the data acquisition device with external sensors and sensitive components, or directly connecting with the measured signal, it can collect and measure such as DC voltage signal, AC voltage signal, DC current signal, AC Current signal, frequency signal, temperature signal, pressure signal, pressure signal and other measured signals. [0003] Such as figure 1 As shown, it is a schematic structural diagram of a data acquisition device and a module card, the data acquisition device 100 includes: a main control unit 101 and a backplane unit 102, and the backplane unit...

AI Technical Summary

Problems solved by technology

In this case, if the data acquisition device is connected with a lot of circuits under test, it is likely to burn the external circuits under test due to automatic restart, which will bring losses to the user, and even bring life safety to the user in serious cases. aspects of injury

This is because, due to the automatic restart of the system, the external circuit to be tested cannot know the corresponding situation and is still in the working state

When the system is restarted, the state of many relay switches is uncertain, and the on-state of each channel is not controlled, which may cause a short circuit of each external tested signal through the analog bus. Once a short circuit occurs, the circuit to be tested will be burned. Yes, if it causes damage to the test environment, such as fire, etc., it may cause harm to life and property safety

[0019] In short, a technical problem that needs to be urgently solved by those skilled in the art is: how to reasonably control the subsequent processing operations of the data acquisition device when the module card is plugged and unplugged, so as to avoid the short circuit of the external circuit under test caused by the direct automatic restart of the system

Images