Spectrum shearing interferometer suitable for measuring shaped pulses

A technology of shearing interferometer and pulse shaping, applied in the direction of instruments, etc., can solve the problems of low accuracy and prone to errors, and achieve the effect of improving flexibility and wide application range

Inactive Publication Date: 2013-08-28
SUN YAT SEN UNIV
View PDF4 Cites 64 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Although the spectral phase coherent electric field reconstruction method (SPIDER) has become one of the mainstream femtosecond pulse measurement technologies in the world, most of the traditional SPIDER systems use the sum frequency method of the pulse to be measured and the strongly chirped pulse, resulting in the shear amount Ω The bandwidth δω of the auxiliary pulse segment participating in the sum frequency is related to the characteristics of the pulse to be measured
Since the characteristics of the shaped pulse obtained during the pulse shaping process (especially the chirp amount and pulse width) will change in a large range, and the spectrum and phase curve may contain transient components, the traditional SPIDER system Errors are prone to occur when measuring the above-mentioned complex shaped pulses, and the accuracy is low
That is to say, the various existing SPIDER systems have certain limitations in measuring shaped pulses

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spectrum shearing interferometer suitable for measuring shaped pulses
  • Spectrum shearing interferometer suitable for measuring shaped pulses
  • Spectrum shearing interferometer suitable for measuring shaped pulses

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0034] Such as figure 1 As shown, a spectral shearing interferometer suitable for measuring shaped pulses includes a beam splitter 1, a plane grating 2, a first concave mirror 3, a double-slit baffle 4, The first reflector 5, the second reflector 6, the third reflector 7, the right-angle reflector 8, the periscope 9 that can rotate the pulse polarization direction by 90 degrees, the fourth reflector 10 with a small hole in the middle, and the second concave surface Reflector 11, fifth reflector 12, second type matching and frequency crystal 13, spatial filter 14, third concave reflector 15, sixth reflector 16, seventh reflector 17, grating spectrometer 18;

[0035] Wherein, the planar grating 2, the first concave reflector 3, the double-slit baffle 4, the first reflector 5, and the second reflector 6 form a special 4f zero dispersion compressor, and the planar grating 2, the first reflector 5, The distance from the second reflector 6 to the first concave reflector 3 is equal ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the field of shaped pulse measurement, in particular to a spectrum shearing interferometer suitable for measuring shaped pulses. A plane grating, a first concave face reflecting mirror, a double-slit baffle, a first reflecting mirror and a second reflecting mirror are used for forming a special 4f zero dispersion compressor, the distance between the plane grating, the first reflecting mirror and the second reflecting mirror and the first concave face reflecting mirror is equal to the focal length of the first concave face reflecting mirror in the 4f zero dispersion compressor, the mode that the 4f zero dispersion compressor is added with the double-slit baffle is used for acquiring two quasi monochromatic long pulses, the two quasi monochromatic long pulses and a pulse to be measured are made to be in sum frequency. According to the mode, a shearing amount omega and the band width delta omega of an auxiliary pulse segment participating in sum frequency can be prevented from varying along with the change of the characteristics of the pulses to be measured, the shearing amount omega can be changed conveniently to measure the same pulse, the corresponding phase difference of each frequency of the pulse can be solved independently, and therefore the shaped pulses with various characteristics can be measured accurately.

Description

technical field [0001] The invention relates to the field of shaped pulse measurement, in particular to a spectral shearing interferometer suitable for measuring shaped pulses. Background technique [0002] Femtosecond pulse shaping technology has important applications in photochemistry, quantum coherence control, microscopic imaging, optical communication, micromachining and other fields. The femtosecond pulse shaping technology is mainly based on the Fourier transform principle, using a programmable spatial light modulator (SLM) to modulate the intensity and phase of each spectral component of the pulse. At present, the pulse shaper mainly uses a liquid crystal spatial light modulator, which can independently modulate the intensity and phase of each spectral component of the pulse, but it is easy to cause a sudden change in the pulse spectrum and / or phase, and it is even easy to synthesize a pulse whose spectrum is divided into several segments. It is difficult to apply ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
Inventor 文锦辉李聪朱伟强谢志鹏
Owner SUN YAT SEN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products