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Method of testing the speed of data transmission from PCI Express equipment to host on the basis of FPGA (field programmable gate array)

A technology of data transmission speed and test method, applied in the direction of detecting faulty computer hardware, etc., can solve the problems of inaccurate test results, no exchange of data, low test speed, etc., and achieve fast test speed and test objectivity. Strong, low test overhead

Inactive Publication Date: 2013-09-25
CHENGDU LINHAI ELECTRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, there is no specific technology for PIPE Core to test the speed of exchanging data between PCI Express devices and host drivers on the market.
However, the test speed of existing speed measurement products is not high, the data exchange speed between the host driver and the device can only reach 150MBytes / s, and the standards for testing the exchange speed between the host driver and the device are different, and the test results are not objective and incorrect

Method used

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  • Method of testing the speed of data transmission from PCI Express equipment to host on the basis of FPGA (field programmable gate array)

Examples

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Embodiment Construction

[0024] Describe technical scheme of the present invention in further detail below in conjunction with accompanying drawing: as figure 1 Shown, a kind of FPGA-based PCI Express device to the data transmission speed test method of host computer, it comprises the following steps:

[0025] S1: Modify the transport layer of the FPGA, and add the speed measurement code to test the data transmission speed between the device and the host;

[0026] S2: setting a device write performance counter;

[0027] S3: The speed measurement code reads the count value of the device write performance counter, and calculates the data transmission speed from the device to the host according to the following method:

[0028] S=V / (C / H)=V*H / (C / (P-1)*P)

[0029] Among them, S is the data writing speed of the device, that is, the data transmission speed from the device to the host, and the unit is Mbyte / s; V is the number of bytes of data read back by the device from the drive memory, and the unit is by...

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Abstract

The invention discloses a method of testing the speed of data transmission from PCI Express equipment to a host on the basis of FPGA (field programmable gate array). The method includes the steps of S1, modifying an FPGA transmission layer, adding a speed measurement code, for the speed of data transmission between test equipment and the host, into the FPGA transmission layer; S2, setting an equipment writing performance counter; S3, allowing the speed measurement code to read a counted value of the equipment writing performance counter, and calculating the speed of data transmission from the equipment to the host according to the equation: S=V / (C / H)=V*H / (C / (P-1)*P). The method has the advantages that testing accuracy is high, measuring speed is high, testing objectivity is high, and testing cost is low.

Description

technical field [0001] The invention relates to a data transmission speed test method from an FPGA-based PCI Express device to a host. Background technique [0002] The data exchange of each functional part in the computer system is realized through the bus, so the speed of the bus has a huge impact on the performance of the whole machine. It was first proposed by Intel Corporation in early 2001, including Intel, AMD. More than 20 industry-leading companies including Dell and IBM drafted new technology specifications at the end of 2001 and completed them in 2002. It was named PCI Express. It has already been widely used due to its high operating frequency and wide transmission bandwidth, and has become a host computer for personal computers. board standard. FPGA (Field-Programmable Gate Array), that is, Field Programmable Gate Array, is a product of further development on the basis of programmable devices such as PAL, GAL, and CPLD. It emerged as a semi-custom circuit in ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 吴伟林李承镛孙建中李凯何戎辽
Owner CHENGDU LINHAI ELECTRONICS
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