Test paper with code information and manufacturing method thereof

A manufacturing method and test paper technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of inability to mass-produce, industrialize, increase sensors, etc., and achieve the advantages of large-scale production and low manufacturing environment requirements. The effect of high control precision

Inactive Publication Date: 2014-07-02
HANGZHOU SEJOY ELECTRONICS & INSTR
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  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

Similar to the second method, this method has high production costs due to the addition of sensors
And the combination of code information that can be represented can only be the power of 2 of the number of resistors, which cannot be industrialized or mass-produced

Method used

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  • Test paper with code information and manufacturing method thereof
  • Test paper with code information and manufacturing method thereof
  • Test paper with code information and manufacturing method thereof

Examples

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Embodiment Construction

[0029] figure 1 Shown is the manufacturing method of the test paper with code information provided according to the first embodiment of the present invention. Such as figure 1 As shown, the manufacturing method of the present invention includes step S11 and step S12.

[0030] In step S11, the corresponding relationship between the test paper code information and the resistance value or capacitance value of the chip resistor or capacitor is determined. The following examples illustrate in detail how to establish a one-to-one correspondence between the resistance value or the capacitance value and the code information. However, the present invention does not make any limitation thereto. In other embodiments, the establishment of the corresponding relationship may be implemented through different algorithms.

[0031] In this field, one way of expressing the code information is expressed by a linear equation in one variable Y=aX+b. Each specific code information corresponds t...

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Abstract

The invention provides a piece of test paper with code information and a manufacturing method thereof. The manufacturing method of the test paper with the code information comprises the steps of determining a corresponding relationship of the code information of the test paper and a chip resistor or a resistance value of a capacitor or a capacitance value, and arranging the chip resistor with the corresponding resistance value or a chip capacitor with the corresponding capacitance value on a middle carrier piece or a substrate. The manufacturing method of the test paper provided by the invention has the advantages that the code information is solidified in the test paper through the two steps, the manufacturing technique procedure is simple, the chip resistor or capacitor is adopted to reduce the production cost greatly, the manufacturing method has a low requirement on the manufacturing environment, and the large-scale production is realized.

Description

technical field [0001] The invention relates to a variety of medical detection test papers and manufacturing processes thereof, in particular to a test paper with code information and a manufacturing method thereof. Background technique [0002] Most medical testing instruments require test strips. The production of test paper is easily affected by the manufacturing process environment (temperature, humidity, etc.), so the properties of the test paper produced in different batches are different, resulting in deviations between the results detected by the testing instrument. In order to reduce the error of test results, each batch of test paper will correspond to a code information when it leaves the factory. By reading the code information, the testing instrument can calibrate the internal measurement program of the testing instrument to reduce errors and obtain correct testing results. [0003] Taking the blood glucose meter as an example, the blood glucose meters current...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/06G01N27/22
CPCG01N33/48771Y10T29/49004
Inventor 韩东征任云华陈军刚廖彦吴建华
Owner HANGZHOU SEJOY ELECTRONICS & INSTR
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