Multifunctional sample stage for measuring block-shaped solid sample in X-ray diffractometer

Abstract

The invention belongs to the technical field of detection equipment and in particular discloses a multifunctional sample stage for a measuring block-shaped solid sample in an X-ray diffractometer. The multifunctional sample stage comprises a base bracket and a sample tank arranged on the base bracket, wherein the sample tank comprises a positioning mask, a sample cell and a mask which are sequentially connected through screws; a central shaft clamping hole is formed in the positioning mask; the central shaft clamping hole is matched with a central shaft of an angular instrument sample stage in size; a spring clamping hole is formed below the central shaft clamping hole; the size of the spring clamping hole is consistent with the size of a spring of the angular instrument sample stage; spirit bubbles are arranged on two side edges of the sample cell. The sample tank is filled with glass powder, a trace powder sample can be tested, flaky large-size or irregular samples which cannot be cut or ground can be tested, and the problems that a current large-size sample cannot be tested or a test can be only performed by cutting the samples during the test and the like are effectively solved.

Description

【Technical field】 [0001] The invention belongs to the technical field of detection equipment, and in particular relates to a multifunctional sample stage for measuring block solid samples for an X-ray diffractometer. 【Background technique】 [0002] At present, for X-ray powder diffractometers, such as X'Pert Pro from PANalytical in the Netherlands, Bruker and Rigaku and other well-known brands of diffractometers, most of the manufacturers provide shallow glass sample chambers for testing powder samples, which cannot be used for solid samples. The test of block and sheet samples, especially for samples with large size (the plane to be tested is larger than 18×20mm) or for larger solid block samples whose length and width exceed the aluminum sample holder cannot be directly tested on the machine At this time, it is often impossible to perform non-destructive testing on some larger solid block samples by cutting the sample or improving the sample test frame, or cutting off a pa...

AI Technical Summary

Problems solved by technology

Although this patent uses a level tester to adjust the placement of the sample to be tested, the adjustment is troublesome

Patent 200720174416.0 discloses a diffractometer sample stage that is convenient for testing thin flake solid samples. By adding supports to the traditional sample stage, both the sample and the support frame must be fixed during the operation. The operation is cumbersome and difficult. Unable to measure thick bulky samples

Patent 201020144904.9 discloses a solid block sample holder for X-ray diffractometer, which is realized by pressing the sample against the reference baffle frame of the sample test surface through a spring installed in the middle of the base. This sample stand is more suitable for block sample testing. However, it is necessary to have a reference baffle on the sample test surface, and there are many parts on the sample table, which requires relatively high production requirements and the sample needs to be cut and destroyed.

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