Z/OS host single platform based test driving system and method

Abstract

The invention discloses a Z / OS host single platform based test driving system. The Z / OS host single platform based test driving system comprises an XML (Extensive Markup Language) format analysis module, an online message analysis module, a parameter configuration module, an online message synthesis module, a test main driving module and a result analysis module; the XML format analysis module is used for performing analysis on an XML format interface to form a format template for online message analysis and synthesis; the online message analysis module is used for performing analysis on the existing online message according to the format template and extracting element item data; the parameter configuration module is used for configuring driving strategy parameters of a test case; the online message synthesis module is used for generating an online message which comprises the element item data and the driving strategy parameters according to the format template; the test main driving module is used for receiving the online message and driving the test process through an EXCI interface provided by a host system; the result analysis module is used for restarting the test main driving module for another round of test under the specific strategy or outputting a final test result. According to the Z / OS host single platform based test driving system and method, the assembly delay caused by the development progress difference between the modules in the process of parallel development is eliminated and reuse and automatic processing on the test case is implemented.

Description

technical field [0001] The invention relates to an internal test drive system and method in the software development process, in particular to a test drive system and method based on a Z / OS host single platform. Background technique [0002] In the process of software development, due to factors such as product scale and function division, in order to improve development efficiency and enhance response, the strategy of dividing modules and developing in parallel is often adopted in the development of software systems. [0003] In this situation, due to factors such as inconsistent development progress of each module and complex connectivity of each module's development environment, the lack of assembly or short assembly time of internal tests between different modules of the same task affects the effect of defect identification and elimination, resulting in The integration testing phase is exposed intensively due to insufficient internal testing. [0004] Especially for hos...

AI Technical Summary

Problems solved by technology

However, such tools have unfavorable factors such as high external dependence, need for other product support, high consumption of external systems, and complicated test process; while the stress test in the internal test phase of a single (or several) modules has simple test process, lack of external support, There is no connection between modules, so an effective method for stress testing on a single platform is needed

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