Test-driven system and method based on single platform of z/os mainframe
A test-driven, single technology, applied in the field of test-driven systems based on a single platform of the Z/OS host, can solve problems such as lack of external support, high external dependence, and large external system consumption, and achieve multiplexing and automatic processing, platform The effect of the advantages of independence and the advantages of ease of operation
Active Publication Date: 2017-07-11
BANK OF CHINA
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Problems solved by technology
However, such tools have unfavorable factors such as high external dependence, need for other product support, high consumption of external systems, and complicated test process; while the stress test in the internal test phase of a single (or several) modules has simple test process, lack of external support, There is no connection between modules, so an effective method for stress testing on a single platform is needed
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[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific implementation cases and with reference to the accompanying drawings.
[0024] Such as figure 1 As shown, the present invention provides a test drive system based on a single platform of Z / OS mainframe, including the following modules: XML format analysis module, online message analysis module, online message synthesis module, parameter configuration module, test master Driver module and result analysis module.
[0025] Among them, the XML format analysis module is responsible for analyzing the XML format interface used by the counter channel to form a format template for online message analysis and synthesis;
[0026] The online message analysis module is responsible for analyzing the existing message according to the format template formed by XML format analysis, and extracting el...
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The invention discloses a test drive system based on a single platform of a Z / OS mainframe, comprising: an XML format analysis module for analyzing an XML format interface to form a format template for online message analysis and synthesis; an online message analysis module , for analyzing the existing online message according to the format template, and extracting element item data; a parameter configuration module, for configuring the driving strategy parameters of the test case; an online message synthesis module, for according to the format template Generate online messages containing element item data and driving strategy parameters; test the main driver module, used to receive online messages, and drive the test process through the EXCI interface provided by the host system; result analysis module, restart the test main driver under a specific strategy The module performs another round of testing, or outputs the final test results. The invention not only eliminates the assembly delay caused by the development progress difference among modules in the parallel development process, but also realizes the reuse and automatic processing of test cases.
Description
technical field [0001] The invention relates to an internal test drive system and method in the software development process, in particular to a test drive system and method based on a Z / OS host single platform. Background technique [0002] In the process of software development, due to factors such as product scale and function division, in order to improve development efficiency and enhance response, the strategy of dividing modules and developing in parallel is often adopted in the development of software systems. [0003] In this situation, due to factors such as inconsistent development progress of each module and complex connectivity of each module's development environment, the lack of assembly or short assembly time of internal tests between different modules of the same task affects the effect of defect identification and elimination, resulting in The integration testing phase is exposed intensively due to insufficient internal testing. [0004] Especially for hos...
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IPC IPC(8): G06F11/36
Inventor 刘文博陈晨
Owner BANK OF CHINA