Millimeter wave free oscillation source automatic test system and method

An automatic test system and test method technology, applied in frequency measurement device, electric power measurement by current/voltage, spectrum analysis/Fourier analysis, etc., can solve the problems of low precision, cumbersome test, troublesome data processing, etc. achieve the effect of overcoming inefficiency

Inactive Publication Date: 2014-10-29
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, there is a lack of domestic millimeter-wave automatic test methods: on the one hand, the cost of millimeter-wave test equipment is high, and some millimeter-wave frequency bands lack ready-made test and measurement instruments;

Method used

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  • Millimeter wave free oscillation source automatic test system and method
  • Millimeter wave free oscillation source automatic test system and method

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Example Embodiment

[0059] The following describes the implementation of the present invention through specific specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention.

[0060] See figure 1 The first embodiment of the present invention relates to an automatic test system for millimeter wave free oscillation sources. It should be noted that the illustrations provided in this embodiment mode only illustrate the basic idea of ​​the present invention in a schematic manner. The figures only show the components related to the present invention instead of the number, shape, and shape of the components in actual imple...

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Abstract

The invention provides a millimeter wave free oscillation source automatic test system and method. The system at least comprises a millimeter wave free oscillation source to be tested, a direct current voltage source connected with the millimeter wave free oscillation source to be tested, a directional coupler with an input port connected onto the millimeter wave free oscillation source to be measured, an attenuator connected onto a coupling output port of the directional coupler, a mixer connected with the attenuator, a frequency analyzer connected onto the mixer, a power sensor connected onto a direct through output port of the directional coupler and a power meter connected onto the power sensor. Synchronous test of multiple performance parameters of the millimeter wave free oscillation source can be achieved through single connection, test data can be stored synchronously to facilitate follow-up processing, and automatic test of output frequency, output power and direct current power consumption of the millimeter wave free oscillation source in full band can be achieved.

Description

technical field [0001] The invention relates to the technical field of millimeter wave testing, in particular to an automatic testing system and testing method for a millimeter wave free oscillation source. Background technique [0002] Millimeter waves have good atmospheric penetration characteristics and rich spectrum resources, and have great significance and application prospects in the fields of communication, guidance, radar, and clinical medicine. The millimeter-wave free-oscillating source is the core of the millimeter-wave communication system, and its output frequency, phase noise, linearity and tuning characteristics are related to the performance of the entire communication system. [0003] At present, there is a lack of domestic millimeter-wave automatic test methods: on the one hand, the cost of millimeter-wave test equipment is high, and some millimeter-wave frequency bands lack ready-made test and measurement instruments; Multiple connection step-by-step tes...

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Application Information

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IPC IPC(8): G01R23/16G01R23/02G01R21/06
Inventor 孙朋飞吴亮孙晓玮丁金义孙芸钱蓉佟瑞王志高
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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