The application provides a topological
phase discrimination method based on bulk region measurement. The method comprises the following steps: step 1, measuring S 21 parameters in a bulk region of a
crystal with spatial symmetry, wherein the bulk region is a region except a boundary
primitive cell; step 2, obtaining a field distribution with a phase from the S 21 parameters, performing
Fourier transform on the field distribution, and then performing intrinsic state projection on the Fourier-transformed field distribution to obtain band structure information; and step 3, according to the band structure information, using a symmetry index theory to specifically discriminate the topological phase of the
crystal. The method of the application uses the spatial symmetry of the topological structure, is based on bulk region measurement, realizes topological
phase discrimination independent of boundary measurement, breaks through the limitation that traditional topological
phase discrimination requires a
full band gap and an interface state in a
band gap, and has an immune feature to a defect state, and can adapt to a wider topological phase discrimination scene.