The application relates to the technical field of
electronic component testing, and specifically provides an
electronic component aging test equipment which comprises a supporting seat and a test
workbench, the supporting seat is provided with a centrifugal rotating mechanism, and the test
workbench is connected to the centrifugal rotating mechanism; a plurality of test stations are arranged on the test
workbench, a plurality of connecting terminals are arranged on a
single test station, the lower ends of the connecting terminals arranged on the same side are sequentially decreased in height; the lower ends of the connecting terminals of the test stations arranged on the same side and at the same height are electrically connected to a test electric column; the centrifugal rotating mechanism drives the test workbench to centrifugally rotate, so that the gravity acceleration environment in
aviation flight can be simulated; the multiple connecting terminals with decreasing heights arranged on the same
test station can be connected with multiple test electric columns, so that multiple-pin synchronous testing is realized; the application combines centrifugal rotating
dynamic testing, multiple-pin synchronous testing and heat dissipation optimization, and the efficiency and accuracy of the
electronic component aging test are significantly improved.