Accelerated test method for comprehensive stress reliability of mechanical and electrical products

A technology of comprehensive stress and accelerated testing, applied in the testing, measuring devices and instruments of machines/structural components, etc., can solve the problems of low test efficiency and single mechanism, and achieve the effect of accurate calculation results and improved efficiency.

Active Publication Date: 2017-09-01
SHANGHAI INST OF ELECTROMECHANICAL ENG
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Problems solved by technology

[0004] The purpose of the present invention is to provide an accelerated test method for the comprehensive stress reliability of the whole machine of electromechanical products, solve the problems of single failure mechanism and low test efficiency of the whole machine of electromechanical products, and improve the efficiency of accelerated tests

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  • Accelerated test method for comprehensive stress reliability of mechanical and electrical products
  • Accelerated test method for comprehensive stress reliability of mechanical and electrical products
  • Accelerated test method for comprehensive stress reliability of mechanical and electrical products

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Embodiment Construction

[0023] The present invention will be further described below in conjunction with the accompanying drawings and implementation examples.

[0024] Such as figure 1 As shown, the present invention is specifically realized through the following process:

[0025] 1) Determine the failure distribution of electromechanical complete machine products through numerical simulation

[0026] Analyze the complete machine of an electromechanical product, which includes N unit products, among which the electronic component products whose failure distribution obeys the exponential distribution are N 1 The mechanical parts and precision electronic devices whose failure distribution obeys the Weibull distribution have N 2 Raw materials and typical process products whose failure distribution obeys lognormal distribution are N 3 indivual. The failure distribution of the complete machine is determined by numerical simulation. The main steps are:

[0027] ① Use engineering experience, cons...

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Abstract

The invention discloses a reliability acceleration testing method of a combined stress of an integrated mechanical and electrical product. The method comprises the following steps: determining failure distribution of integrated mechanical and electrical products based on numerical simulation; using a combined stress as an integrated accelerated stress and determining an integrated stress acceleration model; and calculating an integrated acceleration coefficient by using the numerical simulation. According to the invention, the combined stress is used as the integrated acceleration test stress and the failure distribution and the of the acceleration coefficient of the integrated mechanical and electrical product are determined by using the numerical simulation method, thereby solving problems that the failure distribution of the integrated mechanical and electrical product can not be determined, the acceleration coefficient calculation error is large, the integrated failure mechanism excited by the single stress is single, and the test efficiency is low.

Description

technical field [0001] The invention relates to the field of reliability test technology, in particular to an accelerated test method for comprehensive stress reliability of a complete machine of electromechanical products. Background technique [0002] At present, the reliability acceleration test carried out on the whole machine of electromechanical products simply assumes that the failure distribution of the whole machine of electromechanical products obeys the exponential distribution, and selects temperature, humidity, vibration or electrical stress as the single accelerated stress, and the failure of the whole machine induced by the test The mechanism is relatively simple, the test efficiency is low, and there are large errors in the calculated acceleration coefficient. [0003] According to the needs in actual work, the industry needs to use the comprehensive stress that can more stimulate product failure in the accelerated test, and needs to obtain the failure distri...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M99/00
Inventor 胡剑敏张绍伟徐银波李加宝王蓓张林梅顾静
Owner SHANGHAI INST OF ELECTROMECHANICAL ENG
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