Missile full-missile double-platform parallel excitation reliability test method and system based on comprehensive stress

A technology of comprehensive stress and test method, applied in the direction of ammunition test, ammunition, weapon accessories, etc., can solve problems such as single, complex test tooling, and unrealistic simulation of boundary characteristics

Inactive Publication Date: 2020-07-07
SHANGHAI INST OF ELECTROMECHANICAL ENG
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Problems solved by technology

[0002] At present, the flight reliability test is carried out at the whole missile level. Generally, temperature, humidity, vibration or electrical stress are selected as the single accelerated stress. The failure mechanism of the whole machine induced by the test is relatively simple, and the test efficiency is low. It will lead to unreasonable product energy distribution, failure to meet multispectral shape, too complicated test tooling, and unrealistic simulation of boundary characteristics

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  • Missile full-missile double-platform parallel excitation reliability test method and system based on comprehensive stress
  • Missile full-missile double-platform parallel excitation reliability test method and system based on comprehensive stress
  • Missile full-missile double-platform parallel excitation reliability test method and system based on comprehensive stress

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[0032] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0033] The present invention proposes for the first time a full-bomb reliability test method that adopts double vibration table excitation in the missile and simulates the flight process of the missile in a comprehensive environment, solves the boundary simulation problem that occurs in the slender body missile reliability test, and more realistically The reliability level of the whole projectile is verified, and the whole projectile is taken as the test object, and the reliability test is carried out th...

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Abstract

The invention provides a missile full-missile double-platform parallel excitation reliability test method and system based on comprehensive stress. The method comprises the steps that a tested comprehensive stress environment profile is determined according to analysis of a mission profile during the use process of a missile, a random vibration scheme of double vibration platforms is determined according to the environment profile, the uniform distribution of vibration input magnitude is guaranteed, a reliability test of a full-missile-grade product is carried out by selecting and using a 20-1scheme in a short time high-risk scheme in GJB 899A, the comprehensive stress is used as the accelerated test stress of the full-missile-grade, and the reliability of the full missile is investigatedthrough double-platform parallel excitation control. According to the method and the system, under the comprehensive stress, a double-platform parallel excitation scheme is simultaneously selected, the full-missile-grade product is selected for testing, and the problems that the full-missile-grade product is difficult to really simulate the environment and the reliability of the full-missile-grade product is difficult to check are solved.

Description

technical field [0001] The invention relates to the technical field of reliability testing, in particular to a reliability testing method and system for full-bomb level double-stage parallel-excited flight based on comprehensive stress. Background technique [0002] At present, the flight reliability test is carried out at the whole missile level. Generally, temperature, humidity, vibration or electrical stress are selected as the single accelerated stress. The failure mechanism of the whole machine induced by the test is relatively simple, and the test efficiency is low. It will lead to unreasonable product energy distribution, failure to meet multispectral shape, too complicated test tooling, and unrealistic simulation of boundary characteristics. [0003] Patent document CN104034498A discloses a kind of fast clamping vibration test bench used for missile vibration testing, by setting on the vibration test bench: a lower base, a vibration table arranged in parallel, and a ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): F42B35/00
CPCF42B35/00
Inventor 张绍伟杜哲汪溢龚琳舒葛朓琳李嵘邵志江姚永超孔维东刘乔
Owner SHANGHAI INST OF ELECTROMECHANICAL ENG
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