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Method and system for measuring the particle size of nanometer particles

A technology of nanoparticle and measurement method, applied in the field of measurement method of nanoparticle size and measurement system thereof, can solve problems such as affecting the accuracy of measurement results, being difficult, and having errors.

Inactive Publication Date: 2016-04-20
SOUTH CHINA NORMAL UNIVERSITY
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  • Abstract
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Problems solved by technology

[0008] However, it is difficult for general users to provide accurate values ​​of these 6 parameters; and if the provided parameters are inaccurate, it will directly affect the accuracy of the measurement results; for example, the provided The temperature T has a ΔT error. Since the viscosity coefficient of the liquid is very sensitive to temperature changes, an additional Δη error will be introduced.

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  • Method and system for measuring the particle size of nanometer particles
  • Method and system for measuring the particle size of nanometer particles

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Embodiment Construction

[0049] see figure 1 , which is a structural block diagram of the measurement system for the particle size of nanoparticles described in the present invention. The measurement system of the particle size of nanoparticles in the present invention includes a dynamic light scattering measurement system 100 and a data processing system 200, and the dynamic light scattering measurement system 100 includes an incident optical path unit, a receiving optical path unit, and a scattering signal acquisition and processing unit; The incident optical path unit includes a laser 111 and a condenser lens 112; the receiving optical path unit includes a sample cell 121, a pinhole diaphragm 122, and a condenser lens 123; the scattered signal acquisition and processing unit includes photodetectors that are electrically connected in turn 131 , discrimination amplifier 132 , counter 133 and correlator 134 .

[0050]The laser 111 is used to emit a laser beam, which enters the sample pool 121 after b...

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Abstract

The invention relates to a method of measuring the particle size of nanometer particles. The method includes S1) measuring a light intensity autocorrelation function curve of a sample to be measured, S2) measuring a light intensity autocorrelation function curve of a reference sample, and S3) processing the light intensity autocorrelation function curve of the sample to be measured and the light intensity autocorrelation function curve of the reference sample by adopting a logarithmic function slope manner to obtain the particle size of particles of the sample to be measured. According to the method, the light intensity autocorrelation function curves are processed by adopting the logarithmic function slope manner, the particle size of the particles of the sample to be measured can be acquired through the particle size of known particles, and the method is more convenient, faster, simpler and more accurate. A system for measuring the particle size of the nanometer particles is also provided.

Description

technical field [0001] The invention belongs to the field of nanoparticle measurement, and in particular relates to a method for measuring the diameter of nanoparticle and a measurement system thereof. Background technique [0002] When light encounters particles in the propagation direction, it will be deflected, which is called light scattering. The spatial distribution and fluctuation of the scattered light carry information such as the particle size and refractive index of the particles. If the particles are suspended in the liquid, the form of scattering that occurs is called "dynamic light scattering". In this form of scattering, the spatial distribution of scattered light will fluctuate randomly due to the movement of the particles. Under certain other conditions , the size of this fluctuation is determined by the particle size, the smaller the particle, the larger the fluctuation, and the worse the time correlation of the scattered light intensity, that is, the fast ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02
CPCG01N15/0205
Inventor 岳成凤唐志列韩鹏彭力吴泳波
Owner SOUTH CHINA NORMAL UNIVERSITY
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