Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Defect detection method and device

A defect detection and defect technology, which is applied in the direction of optical test defects/defects, etc., can solve problems such as hidden worries at the human management level, quality variation, and loss of quality, and achieve the effect of improving accuracy and convenience

Active Publication Date: 2016-05-11
IND TECH RES INST
View PDF6 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the difficulty of this production process is that human judgment will vary from person to person, and it is easy to reduce its quality due to long hours of work, and the variation in quality will cause management troubles
In addition, due to the year-by-year decline of the working population, the factor of the labor force also brings hidden worries to the level of human resources management

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defect detection method and device
  • Defect detection method and device
  • Defect detection method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] The features of the present invention are described in detail in the following embodiments, the content of which is sufficient to enable any person skilled in the art to understand the technical content of the present invention and implement it accordingly, and according to the contents, claims and drawings disclosed in this specification, anyone skilled in the art A skilled person can easily understand the related objects of the present invention. The following examples are to further describe the viewpoints of the present invention in detail, but not to limit the scope of the present invention in any way.

[0044] Please refer to figure 1 , figure 1 It is a flowchart of a defect detection method according to an embodiment of the present invention. Such as figure 1 As shown, the defect detection method of the present invention is based on the following steps: First, in step S101, according to the structure of the workpiece to be tested, the corresponding incident pa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a defect detection method and device, and the method comprises the steps: determining at least one incident path and at least one reflection path for at least one to-be-detected region of the surface of a to-be-detected workpiece according to the structure of the to-be-detected workpiece, wherein the to-be-detected region, the incident path and the reflection path are corresponding to each other in a one-one manner; irradiating the to-be-detected region through a light source according to the corresponding incident path for each to-be-detected region; enabling the reflected light formed by that the light source irradiates the to-be-detected region to be imaged on a screen for each to-be-detected region according to the corresponding reflection path, so as to obtain reflection images, wherein the reflection images are corresponding to the to-be-detected regions in a one-one corresponding manner; and analyzing the reflection images, so as to judge whether the surface of the to-be-detected workpiece has defects or not.

Description

technical field [0001] The present invention relates to a defect detection method and its device, in particular to a defect detection method and its device which utilize light source to irradiate the workpiece surface. Background technique [0002] With the advancement of science and technology, the consumer market's requirements for products are also increasing. Therefore, before shipment of water hardware processing products, 100% manual visual inspection is required. However, the difficulty of this production process is that human judgment will vary from person to person, and it is easy to reduce its quality due to long hours of work, and the variation in quality will cause management troubles. In addition, due to the year-by-year decline in the working population, the factor of the labor force has also brought hidden worries to the level of human resources management. Contents of the invention [0003] In view of the above problems, the present invention proposes a me...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/88
Inventor 洪国峰
Owner IND TECH RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com