Unlock instant, AI-driven research and patent intelligence for your innovation.

Wafer Cassette Inspection Rack

A silicon wafer box and detection frame technology, which is applied in the direction of measuring devices, mechanical measuring devices, instruments, etc., can solve the problems of detecting the deformation of silicon wafer boxes, etc., and achieve the effect of reducing defective damage and improving the yield rate of finished products

Inactive Publication Date: 2018-04-17
江苏有则创投集团有限公司
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is: to overcome the deficiencies of the prior art, to provide a silicon wafer box detection frame to solve the technical problem of detecting whether the silicon wafer box is deformed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wafer Cassette Inspection Rack
  • Wafer Cassette Inspection Rack
  • Wafer Cassette Inspection Rack

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] like figure 1 , figure 2 Shown, a kind of silicon wafer box detection frame comprises:

[0030] The sliding support 4 is connected with the silicon wafer template 7 on the sliding bracket 4, and drives the silicon wafer template 7 to move up and down;

[0031] Guide column 5, the guide column 5 is inserted on the sliding bracket 4, and guides the movement of the sliding bracket 4;

[0032] It is used to connect the positioning plate 6 of the silicon wafer box 10 to be detected, the positioning plate 6 is fixed on the end of the guide column 5, and the positioning plate 6 is provided with a through hole corresponding to the position of the silicon wafer template 7 and used to pass through the silicon wafer template 7 6-1, the sliding bracket 4 slides along the guide column 5 so that the silicon wafer template 7 passes through the above-mentioned through hole 6-1 and is inserted into the silicon wafer box 10 to be tested.

[0033] Preferably, as figure 1 , figure 2...

Embodiment 2

[0041] like figure 1 , figure 2 Shown, a kind of silicon wafer box detection frame comprises:

[0042] The sliding support 4 is connected with the silicon wafer template 7 on the sliding bracket 4, and drives the silicon wafer template 7 to move up and down;

[0043] Guide column 5, the guide column 5 is inserted on the sliding bracket 4, and guides the movement of the sliding bracket 4;

[0044] It is used to connect the positioning plate 6 of the silicon wafer box 10 to be detected, the positioning plate 6 is fixed on the end of the guide column 5, and the positioning plate 6 is provided with a through hole corresponding to the position of the silicon wafer template 7 and used to pass through the silicon wafer template 7 6-1, the sliding bracket 4 slides along the guide column 5 so that the silicon wafer template 7 passes through the above-mentioned through hole 6-1 and is inserted into the silicon wafer box 10 to be tested.

[0045] Preferably, as figure 1 , figure 2...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a silicon wafer box detection frame. The silicon wafer box detection frame comprises a sliding support, a guide column and a positioning plate for being connected with a silicon wafer box to be detected, wherein a silicon wafer template is connected to the sliding support, the sliding support drives the silicon wafer template to vertically move, the guide column is inserted into the sliding support and guides motions of the sliding support, the positioning plate is fixed at the tail end of the guide column and is provided with a through hole corresponding to the position of the silicon wafer box and used for the silicon wafer box to pass through, and the sliding support slides along the guide column so as to enable the silicon wafer template to penetrate through the through hole and to be inserted into the silicon wafer box to be detected. The silicon wafer box detection frame can rapidly check a deformation point of each track of each silicon wafer box so as to facilitate timely repair or replacement, the bad damage rate of silicon wafers is greatly reduced, and the yield of silicon wafer finished products is improved.

Description

technical field [0001] The invention relates to a detection frame for a silicon wafer box, which belongs to the technical field of photovoltaic manufacturing and is mainly used for deformation detection in a silicon wafer insertion box at the silicon wafer manufacturing end of the photovoltaic industry. Background technique [0002] Now that the silicon wafer cutting capacity is getting bigger, ordinary manual insertion can no longer keep up with the cleaning rhythm of the machine, so silicon wafer manufacturing companies gradually use automatic wafer insertion machines to replace ordinary manual insertion. The use of an automatic inserting machine puts forward new requirements for the currently used cassettes. Generally, a cassette can insert 25 silicon wafers. Manual insertion can manually adjust the speed of the wafers in and out and adjust the misalignment to protect the silicon wafers from damage. ; However, the speed of the automatic insertion machine is nearly twice a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B21/32G01B5/00
CPCG01B5/0004G01B21/32
Inventor 林玉往常清吴宝佳
Owner 江苏有则创投集团有限公司