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168results about How to "Improve product yield" patented technology

High-heat-conductivity graphene membrane and preparing method thereof

The invention provides a high-heat-conductivity graphene membrane and a preparing method thereof. The method includes the following steps of A, sequentially coating the surface of a base material withpolyamide acid resin and a graphene oxide solution, and conducting drying to obtain a graphene oxide compound membrane; B, stripping off the graphene oxide compound membrane from the base material toobtain a continuous graphene oxide compound membrane coiled material; C, conducting thermal treatment on the continuous graphene oxide compound membrane coiled material to obtain a carbonized continuous graphene oxide compound membrane; D, conducting graphitization treatment on the carbonized continuous graphene oxide compound membrane to obtain the high-heat-conductivity graphene membrane. The polyamide acid resin and the graphene oxide solution are sequentially formed into membranes, the structure of overlapping the graphene oxide membrane and the polyamide acid membrane is formed, the highheat conductivity of graphene can be more sufficiently realized, meanwhile the thicker graphene membrane can be obtained through stripping, the special requirements in the aerospace field can be met,and meanwhile the product yield of the stripped graphene is improved.
Owner:CHONGQING YUNTIANHUA HIGH END NEW MATERIALS DEV CO LTD

Etching method for improving uniformity of contact hole line width

The invention provides an etching method for improving the uniformity of the contact hole line width. The method comprises the steps that an optical line width measurement instrument is used for measuring and collecting contact hole line width full-mapping data on wafers of the prior batch, so that a database is established; the average value of the contact hole line width full-mapping data of the middle portions of the wafers of the prior batch and the contact hole line width full-mapping data of the edges of the wafers of the prior batch is compared with the value of the contact hole line width required by the technology through the database, so that the width difference of the middle portions of the wafers of the prior batch and the width difference of the edges of the wafers of the prior batch are obtained respectively; according to the width difference of the middle portions of the wafers of the prior batch and the width difference of the edges of the wafers of the prior batch, the etching gas flow of the middle portions of wafers of a later batch and the etching gas flow of the edges of the wafers of the later batch are respectively adjusted through an APC system; in the contact hole etching technology steps, the etching gas flow of the wafers of the later batch is corrected in real time through the APC system, so that influence, caused by the photoetching difference of the wafers of the prior batch, on photoetching of the wafers of the later batch can be avoided, the shortages that the gas flow of the middle portions and the edges of the wafers is not changed in the contact hole etching technology are overcome, and the gas flow change of each portion is accurately mastered.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

Backlight module and display device

The invention provides a backlight module and a display device. The backlight module comprises a back plate and a supporting seat, wherein the back plate comprises a bottom plate, a side plate and a lug, and the lug is provided with a first through hole; the supporting seat comprises a chamfer and a supporting plate; the chamfer extends to the interior of the supporting seat from the side face of the supporting plate facing the side plate; a top plate is arranged above the chamfer and provided with a second through hole corresponding to the first through hole; the supporting plate is arranged on the side wall forming the chamfer and parallel to the top plate, and the supporting plate, the top plate and the side wall form an accommodating area and an opening; and the lug is inserted in the accommodating area and combines and fixes the supporting seat and the back plate through a fixing piece, the first through hole and the second through hole. The lug of the back plate of the backlight module is arranged in the accommodating area of the supporting seat and supported by the supporting plate so that the lug is not easy to generate displacement caused by the action of external force during locking and fixing a bolt, and the locking and fixing of the lug with a lamp holder and a frame is not easy to generate a misplacement condition so as to be beneficial to assembling and improving the product yield.
Owner:AU OPTRONICS (SUZHOU) CORP LTD +1

High-precision ceramic substrate process

The invention discloses a high-precision ceramic substrate process. In the high-precision ceramic substrate process, a ceramic substrate is required to be manufactured in electroplating and high-accuracy exposure/etching ways. Differences from an ordinary ceramic substrate manufactured in a printing way particularly after a metal layer is plated on the surface of the ceramic substrate are that: a dry film is attached to the surface of the metal layer, and is exposed and developed; a conductive metal layer is plated on the exposed surface of the metal layer; the metal layer and the conductive metal layer in a line part are retained by etching; an anaerobic thin strip is adhered to the surface of the conductive metal layer at a preset position, and is made by mixing a preset percent of ceramic powder, a preset percent of glass powder and a preset percent of pasting agent to form size and manufacturing the strip; and the ceramic substrate is fed into an anaerobic furnace for cofiring, and the anaerobic thin strip can form a barricade. The cofiring is performed in the anaerobic furnace, so the conductive metal layer may not be oxidized to overcome the shortcoming of stripping of the plated metal layer or no sticking in welding in subsequent welding and electroplating processes.
Owner:HOLY STONE ENTERPRISE

Assembly tool and process

The invention provides an assembly tool and process which are applied to an assembly procedure of electronic equipment. The electronic equipment comprises a flexible display module and cover plate glass, the flexible display module and the cover plate glass are bonded, and the assembly tool comprises a clamping assembly, a profiling mold, a turnover mechanism and a base film; the profiling mold isprovided with a profiling part and a connecting part which are connected with each other; the clamping assembly is used for clamping and fixing the base film, the base film is arranged on the surfaceof the profiling mold, and the face, back on to the profiling mold, of the base film is used for being bonded with the flexible display module; and the turnover mechanism is arranged on the surface,back on to the profiling mold, of the base film, is arranged opposite to the two sides of the profiling mold; and the turnover mechanism is used for driving the base film to move from one side of theprofiling part to the other side of the profiling part. According to the embodiment of the invention, the assembly of an inverted buckling type flexible screen and the cover plate glass can be realized, the tight fitting of a bent part is ensured, the bonding reliability is improved, and the product yield is improved.
Owner:VIVO MOBILE COMM CO LTD

Multilayer line manufacturing process of wafer-level micro electromechanical system chip encapsulation technology

The invention discloses a multilayer line manufacturing process of wafer-level micro electromechanical system chip encapsulation technology. The process comprises the following flows of: pre-processing, wafer thinning, exposure and development, etching, insulating layer coating, laser drilling, copper sputtering, chemical copper plating pretreatment, chemical copper plating, electric copper plating, exposure and development, copper etching, insulating layer coating and exposure and development, laser drilling, copper sputtering, chemical copper plating pretreatment, chemical copper plating, electric copper plating, exposure and development, copper etching, N (N is more than or equal to 0) times (insulating layer coating and exposure and development, laser drilling, copper sputtering, chemical copper plating pretreatment, chemical copper plating, electric copper plating, exposure and development, copper etching), acid chemical nickel plating, chemical cyanide gilding, solder mask coating and exposure and development, BGA forming, and subsequent cutting, testing and packing. The process for forming a multilayer mutual conduction line effectively deals with product size reduction and line denseness, and improves the yield of products.
Owner:HUATIAN TECH KUNSHAN ELECTRONICS

OLED (Organic Light Emitting Diode) display device and production method thereof

The invention discloses an OLED (Organic Light Emitting Diode) display device and a production method thereof. The OLED display device comprises a substrate, anode layers, pixel defining layers, hole injecting layers, hole transmitting layers, light emitting layers, electron transporting layers, electron injecting layers, spacing pillars and blocking pillars positioned on a region beyond of the spacing pillars on pixel spaced regions; the blocking pillars at least penetrate through the hole transporting layers and the hole injecting layers. In the OLED display device provided by the invention, one spacing pillar is produced in the pixel spacing region between two adjacent light emitting pixels with different colors, and at least one of two inner angles, close to the pixel spacing region, of each blocking pillar is greater than 90 degrees, so that when organic materials such as the hole transporting layers and the hole injecting layers are evaporated, the hole transporting layers and the hole injecting layers can be broken at positions of the blocking pillars, and further transverse current leakage between a certain light-emitting pixel and the adjacent light emitting pixel is reduced when the certain light-emitting pixel is lightened; the problem of light stealing of other light-emitting pixels is solved, and the yield of the product is improved.
Owner:WUHAN TIANMA MICRO ELECTRONICS CO LTD +1

Method for grinding silicon chips

The invention discloses a method for grinding silicon chips. The method is characterized in that the silicon chips are ground by the aid of PWA9 grinding sand slurry; the silicon chips are respectively ground under multilevel pressures, the first-level pressures range from 265kg to 275kg, the rotational speeds range from 4 revolutions/min to 6 revolutions/min, rotational speed ratios range from 0.4 to 0.6, and the grinding time ranges from 40 seconds to 50 seconds; the second-level pressures range from 140kg to 160kg, the rotational speeds range from 14 revolutions/min to 16 revolutions/min, rotational speed ratios range from 0.4 to 0.6, and the grinding time ranges from 60 seconds to 120 seconds; the third-level pressures range from 110kg to 120kg, the rotational speeds range from 24 revolutions/min to 26 revolutions/min, rotational speed ratios range from 0.4 to 0.6, and the grinding time ranges from 60 seconds to 120 seconds; the fourth-level pressures range from 90kg to 110kg, the rotational speeds range from 28 revolutions/min to 32 revolutions/min, rotational speed ratios range from 0.4 to 0.6, and the grinding time ranges from 40 seconds to 50 seconds; the fifth-level pressures range from 65kg to 75kg, the rotational speeds range from 34 revolutions/min to 36 revolutions/min, rotational speed ratios range from 0.4 to 0.6, and the grinding time ranges from 9min to 11min; the various levels of pressures are switched over at time intervals which range from 5 seconds to 15 seconds. The method for grinding the silicon chips has the advantages that the silicon chips are ground by the aid of PWA9 grinding sand, and accordingly the grinding cost can be reduced by 10%; ground products are high in yield, and the defect rate due to saw marks and fragments can be reduced and reaches 0.5%.
Owner:JINGHUA ELECTRONICS MATERIAL
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