Micro material stretching method, device and system

A stretching device, a tiny technology, applied in the direction of measuring devices, analyzing materials, and using stable tension/pressure to test the strength of materials, etc., can solve problems such as the inability to obtain atomic-scale deformation information of nanomaterials

Inactive Publication Date: 2016-10-19
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the embodiment of the present invention expects to provide a micro-material stretching method, device and system, which can at least solve technical problems such as the inability to obtain atomic-scale deformation information of nanomaterials in existing methods for testing the mechanical properties of nanomaterials.

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  • Micro material stretching method, device and system
  • Micro material stretching method, device and system
  • Micro material stretching method, device and system

Examples

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Embodiment 1

[0035] In order to solve technical problems such as the inability to obtain atomic-scale deformation information of nanomaterials in existing nanomaterial mechanical property testing methods, this embodiment provides a tiny material stretching device, such as figure 1 As shown, the device includes:

[0036] The material carrying unit 101 is used to carry and fix tiny materials; the tiny materials mentioned in this embodiment refer to materials whose length and width range from tens of nanometers to several microns, and thicknesses range from tens of angstroms to tens of nanometers. The material carrying unit 101 is used to carry tiny materials. Since the material carrying unit 101 needs to be stressed during the stretching process of the tiny materials and then stretches the tiny materials, it is necessary to fix the tiny materials, otherwise the tiny materials cannot be fixed. Stretch operation.

[0037] The driving unit 102 is used to fix the material carrying unit 101, and...

Embodiment 2

[0048] This embodiment and Embodiment 1 belong to the same inventive concept. This embodiment provides a tiny material stretching method, such as image 3 As shown, the method includes:

[0049] Step S201: fixing the tiny material on the material carrying unit 101;

[0050] The material bearing unit 101 is used to carry and fix tiny materials; Tiny materials must be fixed, otherwise the stretching operation of tiny materials cannot be realized. The material carrying unit 101 includes a carrying film 1011 , and when the size of the tiny material to be measured is of the same order of magnitude as the carrying film 1011 , tensile experiments can be performed on the small material directly on the carrying film 1011 . When the size of the tiny material to be measured is much smaller than the size of the carrier film 1011 , the carrier film 1011 needs to be processed to meet the size requirements of the tiny material. To this end, the carrier film 1011 of this embodiment can be...

Embodiment 3

[0068] This embodiment provides a mechanical property detection system. The mechanical property detection system of this embodiment includes the tiny material stretching device described in Embodiment 1, and also includes other devices for stretching tiny materials through the tiny material stretching device. Experimental equipment, such as transmission electron microscope, etc.

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Abstract

The invention discloses a tiny material stretching device. The device of the invention comprises: a material bearing unit, used to load and fix tiny materials; a driving unit, used to fix the material bearing unit, and use temperature to The material carrying unit applies tension; the supporting unit is used to fix the driving unit; the material carrying unit is arranged on the driving unit; the driving unit is arranged on the supporting unit. The invention also discloses a micro-material stretching method and a mechanical property detection system at the same time.

Description

technical field [0001] The invention belongs to the technical field of performance testing of nanometer materials, and in particular relates to a micro material stretching method, device and system. Background technique [0002] In recent years, due to the limitation of semiconductor line width, people have pinned their hopes for a new generation of technological revolution in the future semiconductor industry on nanomaterials with a size below 100 nanometers, including one-dimensional nanowires, nanotubes, and nanorods; two-dimensional Nano film, nano ring; three-dimensional nano (hollow) ball and other materials. Due to the extremely small size of nanomaterials, in nanodevices based on them, these tiny materials will inevitably be affected by the external environment and various external fields, including force fields, thermal fields, magnetic fields, and electric fields. Therefore, it is particularly important to test various properties of such tiny individuals, because ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/02G01N3/08
Inventor 岳永海郭林
Owner BEIHANG UNIV
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