Method for determination of low-temperature fault distribution of antiskid brake control device

Abstract

The present invention provides a method for determination of low-temperature fault distribution of an antiskid brake control device. Components in the antiskid brake control device are extracted at will to perform low-temperature fault test; calculation is performed according to the test data, and the low-temperature fault distribution of the components is determined according to the calculation result and is taken as the basis of selecting the fault distribution format in the engineering so as to eliminate the error and the resource loss caused in the prior art. According to the invention, the Weibull distribution is employed to assess the low-temperature fault of the antiskid brake control device to prove that the fault of the antiskid brake control device is a loss fault so as to correct the error of taking the loss fault as an accidental fault processing in the prior art and reduce the error in the aspects of fault reasons, fault mechanism and the like.

Description

technical field [0001] The invention relates to the field of low-temperature fault analysis of civil transport aircraft electronic products, in particular to a method for determining the low-temperature fault distribution of an anti-skid brake control device. Background technique [0002] When predicting the reliability of electronic products in the prior art, it is assumed that the failure of electronic products obeys the exponential distribution, no matter what the failure mode is, it is handled in this way. [0003] The anti-skid brake control device is an accessory of the electronic anti-skid brake system of the aircraft. The power supply is provided by the aircraft, and the electrical signal of the wheel speed change is sensed by the receiver wheel speed sensor. control. The anti-skid brake control device can complete normal landing anti-skid brake control, take-off line brake control, wheel-to-wheel protection control, grounding protection control, and wheel anti-rota...

AI Technical Summary

Problems solved by technology

[0067] 3) The reliability prediction model does not distinguish the cause of failure

[0071] 1) A large number of tests and use data prove that the failure of electronic components does not necessarily obey the exponential distribution. If the exponential distribution is not obeyed, the exponential step-by-step processing will bring great errors;

[0072] 2) In the process of predicting the fault, the cause of the fault is not distinguished

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