Scanning type laser induced spectrum surface range analysis and detection system

Abstract

The invention discloses a scanning type laser induced spectrum surface range analysis and detection system. A laser emitting head is connected to an external laser inducing light source. The external laser inducing light source generate lasers, through the laser emitting head, lasers are emitted, and the generation of laser induced plasma is realized. A focusing optical device converges the induction excited laser beams emitted by the laser emitting head onto the surface of a tested sample. Then, a reflector collects the wide spectral range induced plasma scattered light signals of the tested sample and converges the signals into a light collecting device. The light collecting device converges induced plasma scattered light into an optical fiber and transmits the induced plasma scattered light to an external spectrograph; and the external spectrograph divides the spectrum formed by the plasma to obtain spectral strength data of different wavelengths. The wide range (several hundreds of nanometers) spectral collection in a same optical axis is realized, Joule level large energy laser induction can be born, and the efficiency is increased to more than 90%.

Description

technical field [0001] The invention relates to the technical field of photoelectric non-destructive testing, in particular to a scanning laser-induced spectral surface range analysis and detection system. Background technique [0002] Laser-induced plasma spectroscopy (Laser Induced Plasma Spectroscopy, LIPS) detection technology is an analytical technique that uses pulsed laser ablation of substances to generate plasma, and qualitatively or quantitatively studies the composition of substances through plasma emission spectra. It has the advantages of wide application range, fast analysis speed, less destructive measurement, remote non-contact measurement and real-time detection. Laser-induced plasma spectroscopy is a quantitative analysis technique based on the emission spectrum generated by the interaction between laser and material. This method only needs a few micrograms in the measurement process, which can realize non-destructive measurement and can realize the analysi...

AI Technical Summary

Problems solved by technology

Therefore, the induced laser energy of the system is limited to within tens of millijoules, making the optical device easy to damage

At the same time, the anti-reflection of 200 to 800nm, and the high reflectivity of devices near the wavelength of 1064nm are very difficult to coat, and the effect is poor.

Images