Scanning type laser induced spectrum surface range analysis and detection system

A laser-induced, range analysis technology, applied in thermal excitation analysis, material excitation analysis, material analysis by optical means, etc., can solve the problems of easy damage of optical devices, difficult coating, poor effect, etc., to achieve compact layout, Small size structure design, mature and reliable effect of coating technology

Inactive Publication Date: 2017-04-19
ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

Therefore, the induced laser energy of the system is limited to within tens of millijoules, making the optical device easy to damage
At the same time, th

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  • Scanning type laser induced spectrum surface range analysis and detection system
  • Scanning type laser induced spectrum surface range analysis and detection system
  • Scanning type laser induced spectrum surface range analysis and detection system

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[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0029] As an embodiment of the present invention, see figure 1As shown, it is a schematic structural diagram of a scanning laser-induced spectral surface range analysis and detection system in an embodiment of the present invention. The scanning laser-induced spectral surface range analysis and detection system includes a focusing optical device 2, a mirror 4, and a light receiving device 5 And laser emitting head 6. Wherein, the laser emitting head 6 is connected with an external laser inducing light source, and the external laser inducing light source generates laser light, and the laser is emitted through the laser emitting head 6 to realize the occurrence of laser induced plasma. The focusing optical device 2 focuses...

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Abstract

The invention discloses a scanning type laser induced spectrum surface range analysis and detection system. A laser emitting head is connected to an external laser inducing light source. The external laser inducing light source generate lasers, through the laser emitting head, lasers are emitted, and the generation of laser induced plasma is realized. A focusing optical device converges the induction excited laser beams emitted by the laser emitting head onto the surface of a tested sample. Then, a reflector collects the wide spectral range induced plasma scattered light signals of the tested sample and converges the signals into a light collecting device. The light collecting device converges induced plasma scattered light into an optical fiber and transmits the induced plasma scattered light to an external spectrograph; and the external spectrograph divides the spectrum formed by the plasma to obtain spectral strength data of different wavelengths. The wide range (several hundreds of nanometers) spectral collection in a same optical axis is realized, Joule level large energy laser induction can be born, and the efficiency is increased to more than 90%.

Description

technical field [0001] The invention relates to the technical field of photoelectric non-destructive testing, in particular to a scanning laser-induced spectral surface range analysis and detection system. Background technique [0002] Laser-induced plasma spectroscopy (Laser Induced Plasma Spectroscopy, LIPS) detection technology is an analytical technique that uses pulsed laser ablation of substances to generate plasma, and qualitatively or quantitatively studies the composition of substances through plasma emission spectra. It has the advantages of wide application range, fast analysis speed, less destructive measurement, remote non-contact measurement and real-time detection. Laser-induced plasma spectroscopy is a quantitative analysis technique based on the emission spectrum generated by the interaction between laser and material. This method only needs a few micrograms in the measurement process, which can realize non-destructive measurement and can realize the analysi...

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Application Information

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IPC IPC(8): G01N21/71
CPCG01N21/718G01N33/24G01N2201/105
Inventor 赵天卓连富强貊泽强林蔚然刘洋聂树真肖红张鸿博樊仲维
Owner ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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